JPS5710440A - X-ray diffraction goniometer - Google Patents
X-ray diffraction goniometerInfo
- Publication number
- JPS5710440A JPS5710440A JP8478780A JP8478780A JPS5710440A JP S5710440 A JPS5710440 A JP S5710440A JP 8478780 A JP8478780 A JP 8478780A JP 8478780 A JP8478780 A JP 8478780A JP S5710440 A JPS5710440 A JP S5710440A
- Authority
- JP
- Japan
- Prior art keywords
- rotary shaft
- rays
- sample
- rotated
- bragg
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8478780A JPS5710440A (en) | 1980-06-23 | 1980-06-23 | X-ray diffraction goniometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8478780A JPS5710440A (en) | 1980-06-23 | 1980-06-23 | X-ray diffraction goniometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5710440A true JPS5710440A (en) | 1982-01-20 |
| JPH0117098B2 JPH0117098B2 (enrdf_load_stackoverflow) | 1989-03-29 |
Family
ID=13840401
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8478780A Granted JPS5710440A (en) | 1980-06-23 | 1980-06-23 | X-ray diffraction goniometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5710440A (enrdf_load_stackoverflow) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0363853U (enrdf_load_stackoverflow) * | 1989-10-27 | 1991-06-21 | ||
| JPH03186743A (ja) * | 1989-12-16 | 1991-08-14 | Shimadzu Corp | X線回折用ゴニオメータ |
| US6450684B2 (en) * | 1999-12-24 | 2002-09-17 | Canon Kabushiki Kaisha | Radiographic apparatus, radiographic table and radiographic system |
-
1980
- 1980-06-23 JP JP8478780A patent/JPS5710440A/ja active Granted
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0363853U (enrdf_load_stackoverflow) * | 1989-10-27 | 1991-06-21 | ||
| JPH03186743A (ja) * | 1989-12-16 | 1991-08-14 | Shimadzu Corp | X線回折用ゴニオメータ |
| US6450684B2 (en) * | 1999-12-24 | 2002-09-17 | Canon Kabushiki Kaisha | Radiographic apparatus, radiographic table and radiographic system |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0117098B2 (enrdf_load_stackoverflow) | 1989-03-29 |
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