JPS5694276A - Contact resistance testing method - Google Patents

Contact resistance testing method

Info

Publication number
JPS5694276A
JPS5694276A JP17103179A JP17103179A JPS5694276A JP S5694276 A JPS5694276 A JP S5694276A JP 17103179 A JP17103179 A JP 17103179A JP 17103179 A JP17103179 A JP 17103179A JP S5694276 A JPS5694276 A JP S5694276A
Authority
JP
Japan
Prior art keywords
reed switch
contacts
contact resistance
testing method
magnetic field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17103179A
Other languages
Japanese (ja)
Inventor
Masami Takasu
Hideo Nabeya
Ryohei Kinoshita
Akira Ohara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP17103179A priority Critical patent/JPS5694276A/en
Publication of JPS5694276A publication Critical patent/JPS5694276A/en
Pending legal-status Critical Current

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  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

PURPOSE: To enable to test the contact state change with many contact faces to be judged, by applying a magnetic field to a reed switch at varying intensities to space and contact its contacts and comparing the voltage values between the contacts with a predetermined voltage value.
CONSTITUTION: A reed switch 1 is disposed in the position in proximity with a magnet 2 in a housing 3. The one terminal 11 of the reed switch 1 is connected to connection terminals (a), (c) by means of lead wires 4a, 4c and the other terminal 12 to connection terminals (b), (d) by means of lead wires 4b, 4d. The magnetic field spacing and contacting the reed switch 1 is varied with respect to the reed switch 1, whereby its contacts are spaced and contacted, and the voltage between the contacts is measured with a voltmeter 53 and is compared with a predetermined voltage value.
COPYRIGHT: (C)1981,JPO&Japio
JP17103179A 1979-12-28 1979-12-28 Contact resistance testing method Pending JPS5694276A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17103179A JPS5694276A (en) 1979-12-28 1979-12-28 Contact resistance testing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17103179A JPS5694276A (en) 1979-12-28 1979-12-28 Contact resistance testing method

Publications (1)

Publication Number Publication Date
JPS5694276A true JPS5694276A (en) 1981-07-30

Family

ID=15915796

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17103179A Pending JPS5694276A (en) 1979-12-28 1979-12-28 Contact resistance testing method

Country Status (1)

Country Link
JP (1) JPS5694276A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60125582U (en) * 1984-01-31 1985-08-23 日本電気株式会社 Contact resistance characteristic sorter

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60125582U (en) * 1984-01-31 1985-08-23 日本電気株式会社 Contact resistance characteristic sorter

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