JPS5693434A - Counter - Google Patents

Counter

Info

Publication number
JPS5693434A
JPS5693434A JP17066679A JP17066679A JPS5693434A JP S5693434 A JPS5693434 A JP S5693434A JP 17066679 A JP17066679 A JP 17066679A JP 17066679 A JP17066679 A JP 17066679A JP S5693434 A JPS5693434 A JP S5693434A
Authority
JP
Japan
Prior art keywords
selectors
select
signal
operated
shift register
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17066679A
Other languages
Japanese (ja)
Inventor
Masahiro Naka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP17066679A priority Critical patent/JPS5693434A/en
Publication of JPS5693434A publication Critical patent/JPS5693434A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K21/00—Details of pulse counters or frequency dividers
    • H03K21/40—Monitoring; Error detection; Preventing or correcting improper counter operation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318522—Test of Sequential circuits
    • G01R31/318527—Test of counters

Abstract

PURPOSE:To perform the function test of the counter circuit easily with a short test pattern, by using selectors to operate the counter circuit as a shift register at the test time. CONSTITUTION:Select signals are so supplied that selectors 21, 22, and 23 select outputs Q1, Q2 and Q3 respectively and selectors 31, 32, and 33 select input signal IN. Outputs Q1, Q2, and Q3 are given to input terminals D2, D3, and D4, and input signal IN is applied to clock terminals phi2, phi3, and phi4. Here, D type FF11 is operated as a one-stage binary counter. D type FFs 12 and 13 are operated as a shift register which delays the output of FF11 successively with signal (a) as the clock signal.
JP17066679A 1979-12-27 1979-12-27 Counter Pending JPS5693434A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17066679A JPS5693434A (en) 1979-12-27 1979-12-27 Counter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17066679A JPS5693434A (en) 1979-12-27 1979-12-27 Counter

Publications (1)

Publication Number Publication Date
JPS5693434A true JPS5693434A (en) 1981-07-29

Family

ID=15909113

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17066679A Pending JPS5693434A (en) 1979-12-27 1979-12-27 Counter

Country Status (1)

Country Link
JP (1) JPS5693434A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60193474A (en) * 1984-02-21 1985-10-01 ミエツチスラーフ　ミロースキ Digital type repeating rate averaging circuit
US5740219A (en) * 1996-12-03 1998-04-14 Vlsi Technology, Inc. Digital counter test circuit

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60193474A (en) * 1984-02-21 1985-10-01 ミエツチスラーフ　ミロースキ Digital type repeating rate averaging circuit
JPH0510108B2 (en) * 1984-02-21 1993-02-08 Mirowski Mieczyslaw
US5740219A (en) * 1996-12-03 1998-04-14 Vlsi Technology, Inc. Digital counter test circuit

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