JPS5658196A - Memory device having memory part for test - Google Patents

Memory device having memory part for test

Info

Publication number
JPS5658196A
JPS5658196A JP13282179A JP13282179A JPS5658196A JP S5658196 A JPS5658196 A JP S5658196A JP 13282179 A JP13282179 A JP 13282179A JP 13282179 A JP13282179 A JP 13282179A JP S5658196 A JPS5658196 A JP S5658196A
Authority
JP
Japan
Prior art keywords
given
test
memory part
main memory
access
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13282179A
Other languages
Japanese (ja)
Inventor
Toshimasa Takiguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP13282179A priority Critical patent/JPS5658196A/en
Publication of JPS5658196A publication Critical patent/JPS5658196A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To ensure to carry out a test safely which is given under the normal process with no shunt given to the contents of the main memory part, by providing the memory part for test to which an access is given during the test diagnosis to the main memory part of the memory device consisting of the main memory part and the control part.
CONSTITUTION: The memory device consists of the main memory part 1 and the control part 2 and then constitutes an information processor along with the CPU3. The part 1 contains the test memory part 11 having the region which is designated by the address of the fixed bit width m plus the nontest memory part 12 having the regions excepting the above-mentioned region. When the test diagnosis command is given from the CPU3 under the normal process, the fixed m bits are extracted out of the address register 15, and then an access is given to the part 11. In case no test command diagnosis is given, an access is given to the part 12 with the address of the value obtained by adding 2m to the value of the register 15 through addition circuit 17.
COPYRIGHT: (C)1981,JPO&Japio
JP13282179A 1979-10-17 1979-10-17 Memory device having memory part for test Pending JPS5658196A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13282179A JPS5658196A (en) 1979-10-17 1979-10-17 Memory device having memory part for test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13282179A JPS5658196A (en) 1979-10-17 1979-10-17 Memory device having memory part for test

Publications (1)

Publication Number Publication Date
JPS5658196A true JPS5658196A (en) 1981-05-21

Family

ID=15090343

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13282179A Pending JPS5658196A (en) 1979-10-17 1979-10-17 Memory device having memory part for test

Country Status (1)

Country Link
JP (1) JPS5658196A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58128100A (en) * 1982-01-27 1983-07-30 Nec Corp Error processing system for main storage device
JPS62262162A (en) * 1986-05-09 1987-11-14 Hitachi Ltd Semiconductor memory device
JPH01171049A (en) * 1987-12-26 1989-07-06 Fujitsu Ltd System for testing memory in system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58128100A (en) * 1982-01-27 1983-07-30 Nec Corp Error processing system for main storage device
JPS62262162A (en) * 1986-05-09 1987-11-14 Hitachi Ltd Semiconductor memory device
JPH01171049A (en) * 1987-12-26 1989-07-06 Fujitsu Ltd System for testing memory in system

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