JPS5658196A - Memory device having memory part for test - Google Patents
Memory device having memory part for testInfo
- Publication number
- JPS5658196A JPS5658196A JP13282179A JP13282179A JPS5658196A JP S5658196 A JPS5658196 A JP S5658196A JP 13282179 A JP13282179 A JP 13282179A JP 13282179 A JP13282179 A JP 13282179A JP S5658196 A JPS5658196 A JP S5658196A
- Authority
- JP
- Japan
- Prior art keywords
- given
- test
- memory part
- main memory
- access
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To ensure to carry out a test safely which is given under the normal process with no shunt given to the contents of the main memory part, by providing the memory part for test to which an access is given during the test diagnosis to the main memory part of the memory device consisting of the main memory part and the control part.
CONSTITUTION: The memory device consists of the main memory part 1 and the control part 2 and then constitutes an information processor along with the CPU3. The part 1 contains the test memory part 11 having the region which is designated by the address of the fixed bit width m plus the nontest memory part 12 having the regions excepting the above-mentioned region. When the test diagnosis command is given from the CPU3 under the normal process, the fixed m bits are extracted out of the address register 15, and then an access is given to the part 11. In case no test command diagnosis is given, an access is given to the part 12 with the address of the value obtained by adding 2m to the value of the register 15 through addition circuit 17.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13282179A JPS5658196A (en) | 1979-10-17 | 1979-10-17 | Memory device having memory part for test |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13282179A JPS5658196A (en) | 1979-10-17 | 1979-10-17 | Memory device having memory part for test |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5658196A true JPS5658196A (en) | 1981-05-21 |
Family
ID=15090343
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13282179A Pending JPS5658196A (en) | 1979-10-17 | 1979-10-17 | Memory device having memory part for test |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5658196A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58128100A (en) * | 1982-01-27 | 1983-07-30 | Nec Corp | Error processing system for main storage device |
JPS62262162A (en) * | 1986-05-09 | 1987-11-14 | Hitachi Ltd | Semiconductor memory device |
JPH01171049A (en) * | 1987-12-26 | 1989-07-06 | Fujitsu Ltd | System for testing memory in system |
-
1979
- 1979-10-17 JP JP13282179A patent/JPS5658196A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58128100A (en) * | 1982-01-27 | 1983-07-30 | Nec Corp | Error processing system for main storage device |
JPS62262162A (en) * | 1986-05-09 | 1987-11-14 | Hitachi Ltd | Semiconductor memory device |
JPH01171049A (en) * | 1987-12-26 | 1989-07-06 | Fujitsu Ltd | System for testing memory in system |
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