JPS5643567A - Inspection method of circuit substrate - Google Patents
Inspection method of circuit substrateInfo
- Publication number
- JPS5643567A JPS5643567A JP11982079A JP11982079A JPS5643567A JP S5643567 A JPS5643567 A JP S5643567A JP 11982079 A JP11982079 A JP 11982079A JP 11982079 A JP11982079 A JP 11982079A JP S5643567 A JPS5643567 A JP S5643567A
- Authority
- JP
- Japan
- Prior art keywords
- circuit substrate
- inspected
- reference circuit
- potential
- quality
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE: To make it possible to inspect a circuit substrate to be inspected at a high speed and with high reliability by simple constitution, by using a reference circuit substrate having a standard network to the circuit substrate to be inspected.
CONSTITUTION: A circuit substrate to be inspected and a reference circuit substrate having a network to be standard to it are prepared. When deciding the quality of a circuit between the check terminals TP0 and TP1 of the circuit substrate to be inspected, for instance, a constant positive voltage +V is applied to TP0, TP1 is directly connected with the check terminal TP0' corresponding to the reference circuit substrate, and the other check terminal TP1' corresponding to the reference circuit substrate is grounded. When the DC impedance component X1 between TP0 and TP1 is equal with the DC impedance component X1' between TP0' and TP1', it is utilized that the potential V0 of the connecting point of TP1 and TP0' becomes V/2. Namely, when short circuit caused by a soldered bridge, open circuit by pattern-off, resistance failure, etc. exist between TP0 and TP1, the potential V0 slips out of V/2, and therefore the quality is decided by utilizing this.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11982079A JPS5643567A (en) | 1979-09-18 | 1979-09-18 | Inspection method of circuit substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11982079A JPS5643567A (en) | 1979-09-18 | 1979-09-18 | Inspection method of circuit substrate |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5643567A true JPS5643567A (en) | 1981-04-22 |
Family
ID=14771049
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11982079A Pending JPS5643567A (en) | 1979-09-18 | 1979-09-18 | Inspection method of circuit substrate |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5643567A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5171938A (en) * | 1990-04-20 | 1992-12-15 | Yazaki Corporation | Electromagnetic wave fault prevention cable |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS496422A (en) * | 1972-02-14 | 1974-01-21 |
-
1979
- 1979-09-18 JP JP11982079A patent/JPS5643567A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS496422A (en) * | 1972-02-14 | 1974-01-21 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5171938A (en) * | 1990-04-20 | 1992-12-15 | Yazaki Corporation | Electromagnetic wave fault prevention cable |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CH607666A5 (en) | Method for mechanically and electrically connecting two members each bearing a bundle of electrical conductors, and adhesive for implementing the method | |
DE3213039A1 (en) | ACTIVE VOLTAGE SWITCH | |
KR900015394A (en) | Cable assembly manufacturing method | |
ATE39395T1 (en) | BRIDGE ELEMENT. | |
JPS5643567A (en) | Inspection method of circuit substrate | |
DE69508055D1 (en) | APPARATUS WITH TRANSIENT VOLTAGE SUPPRESSION | |
JPH0480529B2 (en) | ||
JPS552956A (en) | Automatic wiring tester | |
JPH0413665Y2 (en) | ||
JPS5715454A (en) | Semiconductor device | |
JPS55101064A (en) | Continuity check unit | |
KR0129915Y1 (en) | Socket card | |
JPS57128938A (en) | Device for measuring characteristic of semiconductor | |
JPH08105935A (en) | Semiconductor integrated circuit inspection device | |
JP2806658B2 (en) | Battery low voltage detection circuit | |
JPS564957A (en) | Bus circuit | |
KR950025940A (en) | Disconnection inspection device and inspection method by bus line blocking of semiconductor devices | |
JPS56152357A (en) | Offset potential applying method | |
JPS62204553A (en) | Contact marker for measurement of semiconductor device | |
JPH0695120B2 (en) | Electronic component measuring device | |
JPS52116895A (en) | Wiring order tester | |
JPH0555339A (en) | Semiconductor device measuring device | |
JPS6484166A (en) | Testing method for electronic circuit module | |
JPS6484630A (en) | Measuring jig for semiconductor integrated circuit | |
JPS55153201A (en) | Priority selective circuit |