JPS5643567A - Inspection method of circuit substrate - Google Patents

Inspection method of circuit substrate

Info

Publication number
JPS5643567A
JPS5643567A JP11982079A JP11982079A JPS5643567A JP S5643567 A JPS5643567 A JP S5643567A JP 11982079 A JP11982079 A JP 11982079A JP 11982079 A JP11982079 A JP 11982079A JP S5643567 A JPS5643567 A JP S5643567A
Authority
JP
Japan
Prior art keywords
circuit substrate
inspected
reference circuit
potential
quality
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11982079A
Other languages
Japanese (ja)
Inventor
Takeshi Oami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pioneer Corp
Original Assignee
Pioneer Electronic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pioneer Electronic Corp filed Critical Pioneer Electronic Corp
Priority to JP11982079A priority Critical patent/JPS5643567A/en
Publication of JPS5643567A publication Critical patent/JPS5643567A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE: To make it possible to inspect a circuit substrate to be inspected at a high speed and with high reliability by simple constitution, by using a reference circuit substrate having a standard network to the circuit substrate to be inspected.
CONSTITUTION: A circuit substrate to be inspected and a reference circuit substrate having a network to be standard to it are prepared. When deciding the quality of a circuit between the check terminals TP0 and TP1 of the circuit substrate to be inspected, for instance, a constant positive voltage +V is applied to TP0, TP1 is directly connected with the check terminal TP0' corresponding to the reference circuit substrate, and the other check terminal TP1' corresponding to the reference circuit substrate is grounded. When the DC impedance component X1 between TP0 and TP1 is equal with the DC impedance component X1' between TP0' and TP1', it is utilized that the potential V0 of the connecting point of TP1 and TP0' becomes V/2. Namely, when short circuit caused by a soldered bridge, open circuit by pattern-off, resistance failure, etc. exist between TP0 and TP1, the potential V0 slips out of V/2, and therefore the quality is decided by utilizing this.
COPYRIGHT: (C)1981,JPO&Japio
JP11982079A 1979-09-18 1979-09-18 Inspection method of circuit substrate Pending JPS5643567A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11982079A JPS5643567A (en) 1979-09-18 1979-09-18 Inspection method of circuit substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11982079A JPS5643567A (en) 1979-09-18 1979-09-18 Inspection method of circuit substrate

Publications (1)

Publication Number Publication Date
JPS5643567A true JPS5643567A (en) 1981-04-22

Family

ID=14771049

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11982079A Pending JPS5643567A (en) 1979-09-18 1979-09-18 Inspection method of circuit substrate

Country Status (1)

Country Link
JP (1) JPS5643567A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5171938A (en) * 1990-04-20 1992-12-15 Yazaki Corporation Electromagnetic wave fault prevention cable

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS496422A (en) * 1972-02-14 1974-01-21

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS496422A (en) * 1972-02-14 1974-01-21

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5171938A (en) * 1990-04-20 1992-12-15 Yazaki Corporation Electromagnetic wave fault prevention cable

Similar Documents

Publication Publication Date Title
CH607666A5 (en) Method for mechanically and electrically connecting two members each bearing a bundle of electrical conductors, and adhesive for implementing the method
DE3213039A1 (en) ACTIVE VOLTAGE SWITCH
KR900015394A (en) Cable assembly manufacturing method
ATE39395T1 (en) BRIDGE ELEMENT.
JPS5643567A (en) Inspection method of circuit substrate
DE69508055D1 (en) APPARATUS WITH TRANSIENT VOLTAGE SUPPRESSION
JPH0480529B2 (en)
JPS552956A (en) Automatic wiring tester
JPH0413665Y2 (en)
JPS5715454A (en) Semiconductor device
JPS55101064A (en) Continuity check unit
KR0129915Y1 (en) Socket card
JPS57128938A (en) Device for measuring characteristic of semiconductor
JPH08105935A (en) Semiconductor integrated circuit inspection device
JP2806658B2 (en) Battery low voltage detection circuit
JPS564957A (en) Bus circuit
KR950025940A (en) Disconnection inspection device and inspection method by bus line blocking of semiconductor devices
JPS56152357A (en) Offset potential applying method
JPS62204553A (en) Contact marker for measurement of semiconductor device
JPH0695120B2 (en) Electronic component measuring device
JPS52116895A (en) Wiring order tester
JPH0555339A (en) Semiconductor device measuring device
JPS6484166A (en) Testing method for electronic circuit module
JPS6484630A (en) Measuring jig for semiconductor integrated circuit
JPS55153201A (en) Priority selective circuit