JPS5640772A - Electric characteristic measurement method for semiconductor integrated circuit device using capacitor mounted externally - Google Patents

Electric characteristic measurement method for semiconductor integrated circuit device using capacitor mounted externally

Info

Publication number
JPS5640772A
JPS5640772A JP11646879A JP11646879A JPS5640772A JP S5640772 A JPS5640772 A JP S5640772A JP 11646879 A JP11646879 A JP 11646879A JP 11646879 A JP11646879 A JP 11646879A JP S5640772 A JPS5640772 A JP S5640772A
Authority
JP
Japan
Prior art keywords
capacitor
potential
integrated circuit
semiconductor integrated
circuit device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11646879A
Other languages
Japanese (ja)
Other versions
JPS628750B2 (en
Inventor
Hisao Sekine
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP11646879A priority Critical patent/JPS5640772A/en
Publication of JPS5640772A publication Critical patent/JPS5640772A/en
Publication of JPS628750B2 publication Critical patent/JPS628750B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE: To reduce the time loss up to the start of measurement, by quickly charging the externally mounted capacitor.
CONSTITUTION: The terminal 2 of the DUT is first connected to the capacitor C1 via the switch S. The capacitor C1 has a small capacity and the potential at the point A is quickly risen with the charging after the application of power supply and reaches a steady-state. The potential at the point A is delivered to one end of the capacitor Cf of a large capacitance another end of which is grounded via the voltage follower 6, and the capacitor Cf is quickly charged. The measurement of the electric characteristics by this circuit can immediately be started when the switch S is selected to the capacitor Cf immediately after the potential for the capacitors C1 and Cf is at steady potential.
COPYRIGHT: (C)1981,JPO&Japio
JP11646879A 1979-09-11 1979-09-11 Electric characteristic measurement method for semiconductor integrated circuit device using capacitor mounted externally Granted JPS5640772A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11646879A JPS5640772A (en) 1979-09-11 1979-09-11 Electric characteristic measurement method for semiconductor integrated circuit device using capacitor mounted externally

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11646879A JPS5640772A (en) 1979-09-11 1979-09-11 Electric characteristic measurement method for semiconductor integrated circuit device using capacitor mounted externally

Publications (2)

Publication Number Publication Date
JPS5640772A true JPS5640772A (en) 1981-04-17
JPS628750B2 JPS628750B2 (en) 1987-02-24

Family

ID=14687843

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11646879A Granted JPS5640772A (en) 1979-09-11 1979-09-11 Electric characteristic measurement method for semiconductor integrated circuit device using capacitor mounted externally

Country Status (1)

Country Link
JP (1) JPS5640772A (en)

Also Published As

Publication number Publication date
JPS628750B2 (en) 1987-02-24

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