JPS5640772A - Electric characteristic measurement method for semiconductor integrated circuit device using capacitor mounted externally - Google Patents
Electric characteristic measurement method for semiconductor integrated circuit device using capacitor mounted externallyInfo
- Publication number
- JPS5640772A JPS5640772A JP11646879A JP11646879A JPS5640772A JP S5640772 A JPS5640772 A JP S5640772A JP 11646879 A JP11646879 A JP 11646879A JP 11646879 A JP11646879 A JP 11646879A JP S5640772 A JPS5640772 A JP S5640772A
- Authority
- JP
- Japan
- Prior art keywords
- capacitor
- potential
- integrated circuit
- semiconductor integrated
- circuit device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE: To reduce the time loss up to the start of measurement, by quickly charging the externally mounted capacitor.
CONSTITUTION: The terminal 2 of the DUT is first connected to the capacitor C1 via the switch S. The capacitor C1 has a small capacity and the potential at the point A is quickly risen with the charging after the application of power supply and reaches a steady-state. The potential at the point A is delivered to one end of the capacitor Cf of a large capacitance another end of which is grounded via the voltage follower 6, and the capacitor Cf is quickly charged. The measurement of the electric characteristics by this circuit can immediately be started when the switch S is selected to the capacitor Cf immediately after the potential for the capacitors C1 and Cf is at steady potential.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11646879A JPS5640772A (en) | 1979-09-11 | 1979-09-11 | Electric characteristic measurement method for semiconductor integrated circuit device using capacitor mounted externally |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11646879A JPS5640772A (en) | 1979-09-11 | 1979-09-11 | Electric characteristic measurement method for semiconductor integrated circuit device using capacitor mounted externally |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5640772A true JPS5640772A (en) | 1981-04-17 |
JPS628750B2 JPS628750B2 (en) | 1987-02-24 |
Family
ID=14687843
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11646879A Granted JPS5640772A (en) | 1979-09-11 | 1979-09-11 | Electric characteristic measurement method for semiconductor integrated circuit device using capacitor mounted externally |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5640772A (en) |
-
1979
- 1979-09-11 JP JP11646879A patent/JPS5640772A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS628750B2 (en) | 1987-02-24 |
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