JPS5640741A - Measuring device of light scattering fine particle - Google Patents

Measuring device of light scattering fine particle

Info

Publication number
JPS5640741A
JPS5640741A JP11659279A JP11659279A JPS5640741A JP S5640741 A JPS5640741 A JP S5640741A JP 11659279 A JP11659279 A JP 11659279A JP 11659279 A JP11659279 A JP 11659279A JP S5640741 A JPS5640741 A JP S5640741A
Authority
JP
Japan
Prior art keywords
particles
scattering
light
detection section
scattering light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11659279A
Other languages
English (en)
Inventor
Atsushi Seki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rion Co Ltd
Original Assignee
Rion Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rion Co Ltd filed Critical Rion Co Ltd
Priority to JP11659279A priority Critical patent/JPS5640741A/ja
Publication of JPS5640741A publication Critical patent/JPS5640741A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/02Investigating particle size or size distribution
    • G01N15/0205Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
JP11659279A 1979-09-11 1979-09-11 Measuring device of light scattering fine particle Pending JPS5640741A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11659279A JPS5640741A (en) 1979-09-11 1979-09-11 Measuring device of light scattering fine particle

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11659279A JPS5640741A (en) 1979-09-11 1979-09-11 Measuring device of light scattering fine particle

Publications (1)

Publication Number Publication Date
JPS5640741A true JPS5640741A (en) 1981-04-17

Family

ID=14690948

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11659279A Pending JPS5640741A (en) 1979-09-11 1979-09-11 Measuring device of light scattering fine particle

Country Status (1)

Country Link
JP (1) JPS5640741A (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5927443U (ja) * 1982-08-12 1984-02-20 大東計器株式会社 貯炭場等における炭じん等の連続監視装置
JPS60231133A (ja) * 1984-05-01 1985-11-16 Hoya Corp 浮遊粒子計測方法
JPS6361144A (ja) * 1986-09-01 1988-03-17 Hitachi Ltd 微生物測定方法
CN111366505A (zh) * 2020-02-10 2020-07-03 浙江工业大学 空化冲击破碎耦合微细颗粒分散的激光散射法粒度随动检测装置

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5927443U (ja) * 1982-08-12 1984-02-20 大東計器株式会社 貯炭場等における炭じん等の連続監視装置
JPS60231133A (ja) * 1984-05-01 1985-11-16 Hoya Corp 浮遊粒子計測方法
JPS6361144A (ja) * 1986-09-01 1988-03-17 Hitachi Ltd 微生物測定方法
JPH0582901B2 (ja) * 1986-09-01 1993-11-22 Hitachi Ltd
CN111366505A (zh) * 2020-02-10 2020-07-03 浙江工业大学 空化冲击破碎耦合微细颗粒分散的激光散射法粒度随动检测装置

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