JPS5638843A - Mos type semiconductor device - Google Patents
Mos type semiconductor deviceInfo
- Publication number
- JPS5638843A JPS5638843A JP11556579A JP11556579A JPS5638843A JP S5638843 A JPS5638843 A JP S5638843A JP 11556579 A JP11556579 A JP 11556579A JP 11556579 A JP11556579 A JP 11556579A JP S5638843 A JPS5638843 A JP S5638843A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- silicon film
- insulation
- wiring
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
PURPOSE:To prevent a multi-layer wiring from a faulty insulation due to the generation of pinholes by a method wherein an inter-layer insulation film is made of two layer structure of an oxidated silicon film and a nitrided silicon film. CONSTITUTION:The inter-layer insulation film in the multi-layer wiring structure of the MOS type semiconductor device is made of the two layers structure that the nitrided silicon film 6 is formed on the oxidated silicon film 5. Since the etching liquid is different among the nitrided silicon film and the oxidated silicon film, even though there is a pin hole in the thin policrystalline silicon film 7, the inter-layer insulation film is not etched by a light etching or the like, the insulation of the first wiring layer and the second wiring layer can be maintained. Accordingly, since the faulty insulation is not produced, this constitution is effectively used for the highly integrated MOS type semiconductor device having the high melting point metal or the high melting point metal silicon compound gate 8, or an Al or an Al-Si wiring 9.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11556579A JPS5638843A (en) | 1979-09-07 | 1979-09-07 | Mos type semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11556579A JPS5638843A (en) | 1979-09-07 | 1979-09-07 | Mos type semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5638843A true JPS5638843A (en) | 1981-04-14 |
Family
ID=14665689
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11556579A Pending JPS5638843A (en) | 1979-09-07 | 1979-09-07 | Mos type semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5638843A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5539244A (en) * | 1993-03-12 | 1996-07-23 | Hitachi, Ltd. | Power semiconductor device |
-
1979
- 1979-09-07 JP JP11556579A patent/JPS5638843A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5539244A (en) * | 1993-03-12 | 1996-07-23 | Hitachi, Ltd. | Power semiconductor device |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR920020618A (en) | Wiring connection structure of semiconductor device and manufacturing method thereof | |
JPS5638843A (en) | Mos type semiconductor device | |
JPS57145340A (en) | Manufacture of semiconductor device | |
JPS56125855A (en) | Manufacture of semiconductor device | |
FR2428915A1 (en) | Contact prodn. in semiconductor device with multiple wiring layers - using reactive metal film in contact hole between two aluminium layers to prevent faults | |
JPS6445120A (en) | Semiconductor device | |
JPS561547A (en) | Semiconductor device | |
KR900003974A (en) | Manufacturing Method of Semiconductor Device | |
KR930011118A (en) | BPSG layer formation method to prevent surface crystallization | |
JPS57126148A (en) | Semiconductor integrated circuit | |
JPS56161655A (en) | Multilayer aluminum wiring for semiconductor device | |
JPS5789239A (en) | Semiconductor integrated circuit | |
KR950021425A (en) | How to Form Multilayer Metal Wiring | |
KR960026155A (en) | Method of forming contact window of semiconductor device | |
JPS57162448A (en) | Formation of multilayer wiring | |
KR940027101A (en) | Manufacturing Method of Semiconductor Device | |
JPS6442151A (en) | Manufacture of semiconductor device | |
KR950007066A (en) | Metal wiring formation method of semiconductor device | |
JPS5795647A (en) | Integrated circuit device and its manufacture | |
JPS57160154A (en) | Manufacture of semiconductor device | |
JPS6445147A (en) | Semiconductor device | |
KR950007000A (en) | Method of forming planarization film of semiconductor device | |
JPS5519880A (en) | Manufacturing method of semiconductor device | |
JPS5352387A (en) | Semiconductor integrated circuit | |
KR950027946A (en) | Method for manufacturing metallization contact of semiconductor device |