JPS5635026A - Temperature estimating system for heated object - Google Patents

Temperature estimating system for heated object

Info

Publication number
JPS5635026A
JPS5635026A JP11070679A JP11070679A JPS5635026A JP S5635026 A JPS5635026 A JP S5635026A JP 11070679 A JP11070679 A JP 11070679A JP 11070679 A JP11070679 A JP 11070679A JP S5635026 A JPS5635026 A JP S5635026A
Authority
JP
Japan
Prior art keywords
temperature
thermal radiation
radiation factor
slab
furnace temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11070679A
Other languages
Japanese (ja)
Other versions
JPS6140053B2 (en
Inventor
Fumio Kojima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP11070679A priority Critical patent/JPS5635026A/en
Publication of JPS5635026A publication Critical patent/JPS5635026A/en
Publication of JPS6140053B2 publication Critical patent/JPS6140053B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/12—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using thermoelectric elements, e.g. thermocouples
    • G01J5/14—Electrical features thereof
    • G01J5/16—Arrangements with respect to the cold junction; Compensating influence of ambient temperature or other variables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/0037—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the heat emitted by liquids
    • G01J5/004—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the heat emitted by liquids by molten metals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/0044—Furnaces, ovens, kilns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/026—Control of working procedures of a pyrometer, other than calibration; Bandwidth calculation; Gain control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/80—Calibration
    • G01J5/802—Calibration by correcting for emissivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/90—Testing, inspecting or checking operation of radiation pyrometers

Abstract

PURPOSE:To enable accurate temperature estimate, without unsecure elements due to thermal radiation factor, by obtaining the value of suitable thermal radiation factor with the optimum method, so that the calculated furnace temperature to the initially estimated thermal radiation factor and the measured furnace temperature can be equal. CONSTITUTION:In the case of temperature estimate of slab in the heating furnace, for example, first, the initially estimated thermal radiation factor epsilon and furnace temperature T are input to the slab temperature calculator 12 to forecast the slab temperature theta with the simulation based on the specified equation. Further, the initially estimated thermal radiation factor epsilon, fuel flow, and slab temperature theta, are input to the furnace temperature calculator 13 to obtain the furnace temperature T with the simulation based on the specified equation. Next, the furnace temperature T is compared with the actual measurement TM at the comparator 15, and if the temperature deviation is less than the permissible value, the judgement circuit 16 judges that the initially estimated radiation factor epsilon is correct, to output the slab temperature theta from the unit 12. If the deviation is more than the permissible value, the circuit 16 outputs the repetitive calculation command signal and the compensated thermal radiation factor DELTAepsilon is input to the addition circuit 11 for repetitive calculation.
JP11070679A 1979-08-30 1979-08-30 Temperature estimating system for heated object Granted JPS5635026A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11070679A JPS5635026A (en) 1979-08-30 1979-08-30 Temperature estimating system for heated object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11070679A JPS5635026A (en) 1979-08-30 1979-08-30 Temperature estimating system for heated object

Publications (2)

Publication Number Publication Date
JPS5635026A true JPS5635026A (en) 1981-04-07
JPS6140053B2 JPS6140053B2 (en) 1986-09-06

Family

ID=14542386

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11070679A Granted JPS5635026A (en) 1979-08-30 1979-08-30 Temperature estimating system for heated object

Country Status (1)

Country Link
JP (1) JPS5635026A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4881823A (en) * 1988-03-29 1989-11-21 Purdue Research Foundation Radiation thermometry
WO2002075264A1 (en) * 2001-03-06 2002-09-26 Tokyo Electron Limited Temperature measuring method and apparatus and semiconductor heat treatment apparatus
US8741367B2 (en) 2008-07-04 2014-06-03 Cfs Bakel B.V. Food product forming apparatus and process
US9439443B2 (en) 2010-11-23 2016-09-13 Gea Food Solutions Bakel B.V. Apparatus and process for the production with an interleaver

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4881823A (en) * 1988-03-29 1989-11-21 Purdue Research Foundation Radiation thermometry
WO2002075264A1 (en) * 2001-03-06 2002-09-26 Tokyo Electron Limited Temperature measuring method and apparatus and semiconductor heat treatment apparatus
US8741367B2 (en) 2008-07-04 2014-06-03 Cfs Bakel B.V. Food product forming apparatus and process
US9162376B2 (en) 2008-07-04 2015-10-20 Gea Food Solutions Bakel B.V. Food product forming apparatus and process
US9439443B2 (en) 2010-11-23 2016-09-13 Gea Food Solutions Bakel B.V. Apparatus and process for the production with an interleaver
US10398165B2 (en) 2010-11-23 2019-09-03 Gea Food Solutions Bakel B.V. Apparatus and process for the production with an interleaver

Also Published As

Publication number Publication date
JPS6140053B2 (en) 1986-09-06

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