JPS5632581B2 - - Google Patents
Info
- Publication number
- JPS5632581B2 JPS5632581B2 JP5485876A JP5485876A JPS5632581B2 JP S5632581 B2 JPS5632581 B2 JP S5632581B2 JP 5485876 A JP5485876 A JP 5485876A JP 5485876 A JP5485876 A JP 5485876A JP S5632581 B2 JPS5632581 B2 JP S5632581B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5485876A JPS52138183A (en) | 1976-05-14 | 1976-05-14 | Inspecting apparatus for flaw |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5485876A JPS52138183A (en) | 1976-05-14 | 1976-05-14 | Inspecting apparatus for flaw |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS52138183A JPS52138183A (en) | 1977-11-18 |
| JPS5632581B2 true JPS5632581B2 (en。) | 1981-07-29 |
Family
ID=12982279
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5485876A Granted JPS52138183A (en) | 1976-05-14 | 1976-05-14 | Inspecting apparatus for flaw |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS52138183A (en。) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5610462B2 (ja) * | 2007-10-23 | 2014-10-22 | 芝浦メカトロニクス株式会社 | 撮影画像に基づいた検査方法及び検査装置 |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54101390A (en) * | 1978-01-27 | 1979-08-09 | Hitachi Ltd | Foreign matter inspector |
| JPS60122359A (ja) * | 1984-07-04 | 1985-06-29 | Hitachi Ltd | 光学検査装置 |
| JPS6270738A (ja) * | 1985-09-25 | 1987-04-01 | Hitachi Electronics Eng Co Ltd | 異物検出方法 |
| US5835220A (en) * | 1995-10-27 | 1998-11-10 | Nkk Corporation | Method and apparatus for detecting surface flaws |
| JP5794629B2 (ja) * | 2011-06-30 | 2015-10-14 | 国立研究開発法人産業技術総合研究所 | 表面検査装置、表面検査方法、表面検査プログラム、およびコンピュータ読み取り可能な記録媒体 |
| JP6790422B2 (ja) * | 2016-03-31 | 2020-11-25 | 凸版印刷株式会社 | 膜電極接合体の検査方法 |
| JP7090374B2 (ja) * | 2016-11-01 | 2022-06-24 | 凸版印刷株式会社 | 電極触媒層、膜電極接合体及び固体高分子形燃料電池 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS495689A (en。) * | 1972-04-13 | 1974-01-18 | ||
| JPS5631540B2 (en。) * | 1973-01-26 | 1981-07-22 |
-
1976
- 1976-05-14 JP JP5485876A patent/JPS52138183A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5610462B2 (ja) * | 2007-10-23 | 2014-10-22 | 芝浦メカトロニクス株式会社 | 撮影画像に基づいた検査方法及び検査装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS52138183A (en) | 1977-11-18 |