JPS5629704A - Numerical value control system having automatic test function of working cycle - Google Patents

Abstract

PURPOSE:To secure the safety for the entire system as well as eliminate the test circuit for each unit, by giving a direct and integrated test to the overall action sequence to which a test is impossible by the individual test function. CONSTITUTION:The clock pulse generated from the time clock generating circuit 11 is applied to the memory address deciding circuit 12 to decide the memory address of NC. On the other hand, the present positions of the X and Z axes plus tool numbers are supplied to the addresse of memories 14X, 14Z and 14T through AND gates 13X, 13Z and 13T respectively. And thus the data under trial working and every moment receive an address switching by the timing pulse to be stored successively. These stored data are read out successively through AND gates 15X, 15Z and 15T each by the read signal under continuous real working and with every time clock with advance of the address to be then compared with the data under real working through comparators 16X, 16Z and 16T respectively. And when an agreement is obtained for all data, the agreement signal is sent to the control circuit from OR gate 17 for the working. While in case no agreement is obtained, the disagreement signal is sent to the control circuit to discontinue the working cycle.