JPS5627481A - Pattern checker - Google Patents

Pattern checker

Info

Publication number
JPS5627481A
JPS5627481A JP10162579A JP10162579A JPS5627481A JP S5627481 A JPS5627481 A JP S5627481A JP 10162579 A JP10162579 A JP 10162579A JP 10162579 A JP10162579 A JP 10162579A JP S5627481 A JPS5627481 A JP S5627481A
Authority
JP
Japan
Prior art keywords
check
memory
pattern
area
defectives
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10162579A
Other languages
Japanese (ja)
Other versions
JPS6024510B2 (en
Inventor
Michiaki Miyagawa
Masao Nito
Yutaka Yunoki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP54101625A priority Critical patent/JPS6024510B2/en
Publication of JPS5627481A publication Critical patent/JPS5627481A/en
Publication of JPS6024510B2 publication Critical patent/JPS6024510B2/en
Expired legal-status Critical Current

Links

Abstract

PURPOSE:To attain a close check by easily limiting any number of check areas in any shape by comparing the number of detected check areas to an allowable number and by storing the number of defectives in every check area. CONSTITUTION:The surface of cheched pattern 201 is scanned in two dimensions and from video input unit 204 of a TV camera, etc., an analog video signal in time series which corresponds to light and darkness is output. This signal output is converted into a digital signal, pattern end detecting circuit 208 detects a change point from the pattern to the background and with a position signal from scan synchronizing signal generating circuit 227, it is stored in pattern end memory 209 as coordinate values. Further, the number of defectives in every check area is integrated by defective integrating circuit 220, coordinate values in memory 209 are read by processor 230 and in each check area, the number of detected defectives is compared to an allowable number to correct coordinate values in reference level sampling area memory 214. Additionally, any number of check areas in any shape are stored in check area limitation memory 215 to make a close check.
JP54101625A 1979-08-09 1979-08-09 pattern inspection equipment Expired JPS6024510B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP54101625A JPS6024510B2 (en) 1979-08-09 1979-08-09 pattern inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP54101625A JPS6024510B2 (en) 1979-08-09 1979-08-09 pattern inspection equipment

Publications (2)

Publication Number Publication Date
JPS5627481A true JPS5627481A (en) 1981-03-17
JPS6024510B2 JPS6024510B2 (en) 1985-06-13

Family

ID=14305577

Family Applications (1)

Application Number Title Priority Date Filing Date
JP54101625A Expired JPS6024510B2 (en) 1979-08-09 1979-08-09 pattern inspection equipment

Country Status (1)

Country Link
JP (1) JPS6024510B2 (en)

Also Published As

Publication number Publication date
JPS6024510B2 (en) 1985-06-13

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