JPS5625648B2 - - Google Patents

Info

Publication number
JPS5625648B2
JPS5625648B2 JP4100073A JP4100073A JPS5625648B2 JP S5625648 B2 JPS5625648 B2 JP S5625648B2 JP 4100073 A JP4100073 A JP 4100073A JP 4100073 A JP4100073 A JP 4100073A JP S5625648 B2 JPS5625648 B2 JP S5625648B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP4100073A
Other versions
JPS49129530A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4100073A priority Critical patent/JPS5625648B2/ja
Priority to US05/459,219 priority patent/US3937950A/en
Priority to FR7412644A priority patent/FR2225760B1/fr
Priority to DE19742417854 priority patent/DE2417854C3/de
Publication of JPS49129530A publication Critical patent/JPS49129530A/ja
Publication of JPS5625648B2 publication Critical patent/JPS5625648B2/ja
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28Systems for automatic generation of focusing signals
    • G02B7/36Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Automatic Focus Adjustment (AREA)
  • Focusing (AREA)
  • Measurement Of Optical Distance (AREA)
  • Solid State Image Pick-Up Elements (AREA)
JP4100073A 1973-04-11 1973-04-11 Expired JPS5625648B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP4100073A JPS5625648B2 (ja) 1973-04-11 1973-04-11
US05/459,219 US3937950A (en) 1973-04-11 1974-04-08 Focus defecting system
FR7412644A FR2225760B1 (ja) 1973-04-11 1974-04-10
DE19742417854 DE2417854C3 (de) 1973-04-11 1974-04-11 Automatische Scharfeinstelleinrichtung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4100073A JPS5625648B2 (ja) 1973-04-11 1973-04-11

Publications (2)

Publication Number Publication Date
JPS49129530A JPS49129530A (ja) 1974-12-11
JPS5625648B2 true JPS5625648B2 (ja) 1981-06-13

Family

ID=12596130

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4100073A Expired JPS5625648B2 (ja) 1973-04-11 1973-04-11

Country Status (3)

Country Link
US (1) US3937950A (ja)
JP (1) JPS5625648B2 (ja)
FR (1) FR2225760B1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62187959U (ja) * 1986-05-22 1987-11-30
JPH0519264Y2 (ja) * 1986-05-21 1993-05-20

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2406045C2 (de) * 1974-02-08 1983-03-17 Canon Inc., Tokyo Anordnung, bestehend aus wenigstens zwei fotoelektrischen Wandlerelementen
DE2410681A1 (de) * 1974-03-06 1975-09-11 Agfa Gevaert Ag Automatische fokussiervorrichtung
JPS5811602B2 (ja) * 1977-10-26 1983-03-03 敏彦 滑川 自動焦点調節装置
US4309603A (en) * 1979-10-17 1982-01-05 Honeywell Inc. Auto focus system
CA2354614C (en) * 2001-07-30 2002-12-10 Silvano Pregara Autofocus sensor
CN103492835B (zh) 2011-02-15 2016-08-17 巴斯夫欧洲公司 用于光学检测至少一种物体的检测器
US9389315B2 (en) 2012-12-19 2016-07-12 Basf Se Detector comprising a transversal optical sensor for detecting a transversal position of a light beam from an object and a longitudinal optical sensor sensing a beam cross-section of the light beam in a sensor region
CN103217856B (zh) * 2013-05-10 2016-07-06 厦门力鼎光电技术有限公司 一种监控镜头的调焦机构
CN109521397B (zh) 2013-06-13 2023-03-28 巴斯夫欧洲公司 用于光学地检测至少一个对象的检测器
US10353049B2 (en) 2013-06-13 2019-07-16 Basf Se Detector for optically detecting an orientation of at least one object
AU2014280334B2 (en) 2013-06-13 2018-02-01 Basf Se Optical detector and method for manufacturing the same
WO2015024871A1 (en) 2013-08-19 2015-02-26 Basf Se Optical detector
KR20160044009A (ko) 2013-08-19 2016-04-22 바스프 에스이 하나 이상의 물체의 위치를 결정하기 위한 검출기
KR102397527B1 (ko) 2014-07-08 2022-05-13 바스프 에스이 하나 이상의 물체의 위치를 결정하기 위한 검출기
KR102452393B1 (ko) 2014-09-29 2022-10-11 바스프 에스이 적어도 하나의 물체의 포지션을 광학적으로 결정하기 위한 방법 및 검출기 및 이를 이용한 휴먼 머신 인터페이스, 엔터테인먼트 장치, 추적 시스템, 스캐닝 시스템, 입체 시스템 및 카메라
WO2016092451A1 (en) 2014-12-09 2016-06-16 Basf Se Optical detector
US10775505B2 (en) 2015-01-30 2020-09-15 Trinamix Gmbh Detector for an optical detection of at least one object
JP6877418B2 (ja) 2015-07-17 2021-05-26 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも1個の対象物を光学的に検出するための検出器
CN108141579B (zh) 2015-09-14 2020-06-12 特里纳米克斯股份有限公司 3d相机
WO2018019921A1 (en) 2016-07-29 2018-02-01 Trinamix Gmbh Optical sensor and detector for optical detection
CN109923372B (zh) 2016-10-25 2021-12-21 特里纳米克斯股份有限公司 采用集成滤波器的红外光学检测器
KR102431355B1 (ko) 2016-10-25 2022-08-10 트리나미엑스 게엠베하 적어도 하나의 대상체의 광학적 검출을 위한 검출기
US11860292B2 (en) 2016-11-17 2024-01-02 Trinamix Gmbh Detector and methods for authenticating at least one object
US10948567B2 (en) 2016-11-17 2021-03-16 Trinamix Gmbh Detector for optically detecting at least one object
CN110770555A (zh) 2017-04-20 2020-02-07 特里纳米克斯股份有限公司 光学检测器
US11067692B2 (en) 2017-06-26 2021-07-20 Trinamix Gmbh Detector for determining a position of at least one object

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2879405A (en) * 1953-06-29 1959-03-24 Rca Corp Semi-conductor photo-electric devices
US3222531A (en) * 1962-06-26 1965-12-07 Honeywell Inc Solid state junction photopotentiometer
US3193686A (en) * 1963-05-07 1965-07-06 Western Electric Co Photosensitive detectors and methods utilizing photosensitive detectors for positioning articles
DE1913399C3 (de) * 1969-03-17 1974-08-22 Siemens Ag, 1000 Berlin Und 8000 Muenchen Anordnung zur kontinuierlichen Messung von Verschiebungen oder Verformungen mit Hilfe von Laserstrahlen
JPS5618928B2 (ja) * 1971-12-29 1981-05-02

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0519264Y2 (ja) * 1986-05-21 1993-05-20
JPS62187959U (ja) * 1986-05-22 1987-11-30

Also Published As

Publication number Publication date
DE2417854B2 (de) 1977-06-08
JPS49129530A (ja) 1974-12-11
FR2225760A1 (ja) 1974-11-08
US3937950A (en) 1976-02-10
FR2225760B1 (ja) 1976-10-08
DE2417854A1 (de) 1974-10-24

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