JPS49129530A - - Google Patents

Info

Publication number
JPS49129530A
JPS49129530A JP48041000A JP4100073A JPS49129530A JP S49129530 A JPS49129530 A JP S49129530A JP 48041000 A JP48041000 A JP 48041000A JP 4100073 A JP4100073 A JP 4100073A JP S49129530 A JPS49129530 A JP S49129530A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP48041000A
Other versions
JPS5625648B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4100073A priority Critical patent/JPS5625648B2/ja
Priority to US05/459,219 priority patent/US3937950A/en
Priority to FR7412644A priority patent/FR2225760B1/fr
Priority to DE19742417854 priority patent/DE2417854C3/de
Publication of JPS49129530A publication Critical patent/JPS49129530A/ja
Publication of JPS5625648B2 publication Critical patent/JPS5625648B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28—Systems for automatic generation of focusing signals
    • G02B7/36—Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Automatic Focus Adjustment (AREA)
  • Focusing (AREA)
  • Measurement Of Optical Distance (AREA)
  • Solid State Image Pick-Up Elements (AREA)
JP4100073A 1973-04-11 1973-04-11 Expired JPS5625648B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP4100073A JPS5625648B2 (ja) 1973-04-11 1973-04-11
US05/459,219 US3937950A (en) 1973-04-11 1974-04-08 Focus defecting system
FR7412644A FR2225760B1 (ja) 1973-04-11 1974-04-10
DE19742417854 DE2417854C3 (de) 1973-04-11 1974-04-11 Automatische Scharfeinstelleinrichtung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4100073A JPS5625648B2 (ja) 1973-04-11 1973-04-11

Publications (2)

Publication Number Publication Date
JPS49129530A true JPS49129530A (ja) 1974-12-11
JPS5625648B2 JPS5625648B2 (ja) 1981-06-13

Family

ID=12596130

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4100073A Expired JPS5625648B2 (ja) 1973-04-11 1973-04-11

Country Status (3)

Country Link
US (1) US3937950A (ja)
JP (1) JPS5625648B2 (ja)
FR (1) FR2225760B1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5461922A (en) * 1977-10-26 1979-05-18 Toshihiko Kotsukawa Automatic focusing controller

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2406045C2 (de) * 1974-02-08 1983-03-17 Canon Inc., Tokyo Anordnung, bestehend aus wenigstens zwei fotoelektrischen Wandlerelementen
DE2410681A1 (de) * 1974-03-06 1975-09-11 Agfa Gevaert Ag Automatische fokussiervorrichtung
US4309603A (en) * 1979-10-17 1982-01-05 Honeywell Inc. Auto focus system
JPH0519264Y2 (ja) * 1986-05-21 1993-05-20
JPS62187959U (ja) * 1986-05-22 1987-11-30
CA2354614C (en) * 2001-07-30 2002-12-10 Silvano Pregara Autofocus sensor
EP3029485B1 (en) 2011-02-15 2019-12-11 Basf Se Detector for optically detecting at least one object
EP2936052B1 (en) 2012-12-19 2021-04-28 Basf Se Detector for optically detecting at least one object
CN103217856B (zh) * 2013-05-10 2016-07-06 厦门力鼎光电技术有限公司 一种监控镜头的调焦机构
CN105452894B (zh) 2013-06-13 2019-04-30 巴斯夫欧洲公司 用于光学地检测至少一个对象的检测器
KR102252336B1 (ko) 2013-06-13 2021-05-14 바스프 에스이 광학 검출기 및 그의 제조 방법
KR20160019067A (ko) 2013-06-13 2016-02-18 바스프 에스이 적어도 하나의 물체의 배향을 광학적으로 검출하기 위한 검출기
KR102191139B1 (ko) 2013-08-19 2020-12-15 바스프 에스이 광학 검출기
WO2015024870A1 (en) 2013-08-19 2015-02-26 Basf Se Detector for determining a position of at least one object
WO2016005893A1 (en) 2014-07-08 2016-01-14 Basf Se Detector for determining a position of at least one object
KR102452393B1 (ko) 2014-09-29 2022-10-11 바스프 에스이 적어도 하나의 물체의 포지션을 광학적으로 결정하기 위한 방법 및 검출기 및 이를 이용한 휴먼 머신 인터페이스, 엔터테인먼트 장치, 추적 시스템, 스캐닝 시스템, 입체 시스템 및 카메라
US11125880B2 (en) 2014-12-09 2021-09-21 Basf Se Optical detector
CN107438775B (zh) 2015-01-30 2022-01-21 特里纳米克斯股份有限公司 用于至少一个对象的光学检测的检测器
CN108027239B (zh) 2015-07-17 2020-07-24 特里纳米克斯股份有限公司 用于光学检测至少一个对象的检测器
JP6755316B2 (ja) 2015-09-14 2020-09-16 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１つの物体の少なくとも１つの画像を記録するカメラ
JP2019523562A (ja) 2016-07-29 2019-08-22 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 光学的検出のための光センサおよび検出器
WO2018077870A1 (en) 2016-10-25 2018-05-03 Trinamix Gmbh Nfrared optical detector with integrated filter
JP7241684B2 (ja) 2016-10-25 2023-03-17 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１個の対象物の光学的な検出のための検出器
US11635486B2 (en) 2016-11-17 2023-04-25 Trinamix Gmbh Detector for optically detecting at least one object
US11860292B2 (en) 2016-11-17 2024-01-02 Trinamix Gmbh Detector and methods for authenticating at least one object
EP3612805A1 (en) 2017-04-20 2020-02-26 trinamiX GmbH Optical detector
US11067692B2 (en) 2017-06-26 2021-07-20 Trinamix Gmbh Detector for determining a position of at least one object

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2879405A (en) * 1953-06-29 1959-03-24 Rca Corp Semi-conductor photo-electric devices
US3222531A (en) * 1962-06-26 1965-12-07 Honeywell Inc Solid state junction photopotentiometer
US3193686A (en) * 1963-05-07 1965-07-06 Western Electric Co Photosensitive detectors and methods utilizing photosensitive detectors for positioning articles
DE1913399C3 (de) * 1969-03-17 1974-08-22 Siemens Ag, 1000 Berlin Und 8000 Muenchen Anordnung zur kontinuierlichen Messung von Verschiebungen oder Verformungen mit Hilfe von Laserstrahlen
JPS5618928B2 (ja) * 1971-12-29 1981-05-02

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5461922A (en) * 1977-10-26 1979-05-18 Toshihiko Kotsukawa Automatic focusing controller
JPS5811602B2 (ja) * 1977-10-26 1983-03-03 敏彦 滑川 自動焦点調節装置

Also Published As

Publication number Publication date
US3937950A (en) 1976-02-10
JPS5625648B2 (ja) 1981-06-13
FR2225760A1 (ja) 1974-11-08
DE2417854B2 (de) 1977-06-08
DE2417854A1 (de) 1974-10-24
FR2225760B1 (ja) 1976-10-08

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