JPS562517A - Signal processing method of mtf measuring instrument - Google Patents

Signal processing method of mtf measuring instrument

Info

Publication number
JPS562517A
JPS562517A JP7857179A JP7857179A JPS562517A JP S562517 A JPS562517 A JP S562517A JP 7857179 A JP7857179 A JP 7857179A JP 7857179 A JP7857179 A JP 7857179A JP S562517 A JPS562517 A JP S562517A
Authority
JP
Japan
Prior art keywords
regions
signals
values
white
level
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7857179A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6336450B2 (enrdf_load_stackoverflow
Inventor
Yoshio Fukushima
Yoshiaki Kamimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP7857179A priority Critical patent/JPS562517A/ja
Publication of JPS562517A publication Critical patent/JPS562517A/ja
Publication of JPS6336450B2 publication Critical patent/JPS6336450B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0292Testing optical properties of objectives by measuring the optical modulation transfer function

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP7857179A 1979-06-21 1979-06-21 Signal processing method of mtf measuring instrument Granted JPS562517A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7857179A JPS562517A (en) 1979-06-21 1979-06-21 Signal processing method of mtf measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7857179A JPS562517A (en) 1979-06-21 1979-06-21 Signal processing method of mtf measuring instrument

Publications (2)

Publication Number Publication Date
JPS562517A true JPS562517A (en) 1981-01-12
JPS6336450B2 JPS6336450B2 (enrdf_load_stackoverflow) 1988-07-20

Family

ID=13665579

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7857179A Granted JPS562517A (en) 1979-06-21 1979-06-21 Signal processing method of mtf measuring instrument

Country Status (1)

Country Link
JP (1) JPS562517A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58139045A (ja) * 1982-02-05 1983-08-18 ジ−メンス・アクチエンゲゼルシヤフト 光学系の結像品質を表示する方法と装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58139045A (ja) * 1982-02-05 1983-08-18 ジ−メンス・アクチエンゲゼルシヤフト 光学系の結像品質を表示する方法と装置

Also Published As

Publication number Publication date
JPS6336450B2 (enrdf_load_stackoverflow) 1988-07-20

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