JPS5619114B2 - - Google Patents

Info

Publication number
JPS5619114B2
JPS5619114B2 JP8466472A JP8466472A JPS5619114B2 JP S5619114 B2 JPS5619114 B2 JP S5619114B2 JP 8466472 A JP8466472 A JP 8466472A JP 8466472 A JP8466472 A JP 8466472A JP S5619114 B2 JPS5619114 B2 JP S5619114B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP8466472A
Other languages
Japanese (ja)
Other versions
JPS4843589A (enExample
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4843589A publication Critical patent/JPS4843589A/ja
Publication of JPS5619114B2 publication Critical patent/JPS5619114B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
    • H10D30/6737—Thin-film transistors [TFT] characterised by the electrodes characterised by the electrode materials
    • H10D30/6738—Schottky barrier electrodes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/674—Thin-film transistors [TFT] characterised by the active materials
    • H10D30/675—Group III-V materials, Group II-VI materials, Group IV-VI materials, selenium or tellurium
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/80—FETs having rectifying junction gate electrodes
    • H10D30/87—FETs having Schottky gate electrodes, e.g. metal-semiconductor FETs [MESFET]
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H10D62/83—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge
    • H10D62/834—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge further characterised by the dopants
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00—Electrodes of devices having potential barriers
    • H10D64/01—Manufacture or treatment
    • H10D64/012—Manufacture or treatment of electrodes comprising a Schottky barrier to a semiconductor
    • H10D64/0124—Manufacture or treatment of electrodes comprising a Schottky barrier to a semiconductor to Group III-V semiconductors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00—Electrodes of devices having potential barriers
    • H10D64/60—Electrodes characterised by their materials
    • H10D64/64—Electrodes comprising a Schottky barrier to a semiconductor
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D8/00—Diodes
    • H10D8/60—Schottky-barrier diodes 
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2213/00—Indexing scheme relating to G11C13/00 for features not covered by this group
    • G11C2213/30—Resistive cell, memory material aspects
    • G11C2213/33—Material including silicon
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H10D62/85—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group III-V materials, e.g. GaAs

Landscapes

  • Semiconductor Memories (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Junction Field-Effect Transistors (AREA)
  • Static Random-Access Memory (AREA)
JP8466472A 1971-09-30 1972-08-25 Expired JPS5619114B2 (enExample)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH1420171A CH539360A (de) 1971-09-30 1971-09-30 Halbleiterschalt- oder Speichervorrichtung

Publications (2)

Publication Number Publication Date
JPS4843589A JPS4843589A (enExample) 1973-06-23
JPS5619114B2 true JPS5619114B2 (enExample) 1981-05-06

Family

ID=4398777

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8466472A Expired JPS5619114B2 (enExample) 1971-09-30 1972-08-25

Country Status (13)

Country Link
US (1) US3810128A (enExample)
JP (1) JPS5619114B2 (enExample)
CA (1) CA971289A (enExample)
CH (1) CH539360A (enExample)
DE (1) DE2235465C3 (enExample)
ES (1) ES407127A1 (enExample)
FR (1) FR2154538B1 (enExample)
GB (1) GB1394183A (enExample)
HU (1) HU165367B (enExample)
IL (1) IL40282A (enExample)
IT (1) IT967244B (enExample)
NL (1) NL7209934A (enExample)
SE (1) SE384599B (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5240081A (en) * 1975-09-26 1977-03-28 Hitachi Ltd Bi-polar rom
US4167791A (en) * 1978-01-25 1979-09-11 Banavar Jayanth R Non-volatile information storage arrays of cryogenic pin diodes
US4274105A (en) * 1978-12-29 1981-06-16 International Business Machines Corporation MOSFET Substrate sensitivity control
US4646427A (en) * 1984-06-28 1987-03-03 Motorola, Inc. Method of electrically adjusting the zener knee of a lateral polysilicon zener diode
US4965863A (en) * 1987-10-02 1990-10-23 Cray Computer Corporation Gallium arsenide depletion made MESFIT logic cell
US4901279A (en) * 1988-06-20 1990-02-13 International Business Machines Corporation MESFET sram with power saving current-limiting transistors
DE4412475A1 (de) * 1994-04-14 1995-10-19 Daimler Benz Ag Metall-Halbleiter-Diode und Verfahren zur Herstellung von Metall-Halbleiter-Dioden
US5825046A (en) * 1996-10-28 1998-10-20 Energy Conversion Devices, Inc. Composite memory material comprising a mixture of phase-change memory material and dielectric material
US7379317B2 (en) * 2004-12-23 2008-05-27 Spansion Llc Method of programming, reading and erasing memory-diode in a memory-diode array
US7460389B2 (en) * 2005-07-29 2008-12-02 International Business Machines Corporation Write operations for phase-change-material memory
WO2007086311A1 (en) * 2006-01-27 2007-08-02 Semiconductor Energy Laboratory Co., Ltd. Light-emitting material, light-emitting element, light-emitting device, and electronic appliance
EP1821579A3 (en) * 2006-02-17 2008-04-02 Semiconductor Energy Laboratory Co., Ltd. Light emitting element, light emitting device, and electronic appliance
US20070194321A1 (en) * 2006-02-17 2007-08-23 Semiconductor Energy Laboratory Co., Ltd. Light emitting element, light emitting device, and electronic device
US20070278947A1 (en) * 2006-06-02 2007-12-06 Semiconductor Energy Laboratory Co., Ltd. Light-emitting element, manufacturing method thereof, light-emitting device, and electronic device

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3461356A (en) * 1965-08-19 1969-08-12 Matsushita Electric Industrial Co Ltd Negative resistance semiconductor device having an intrinsic region
CA813537A (en) * 1967-10-17 1969-05-20 Radio Corporation Of America Semiconductor memory device
CH506188A (de) * 1970-09-02 1971-04-15 Ibm Feldeffekt-Transistor

Also Published As

Publication number Publication date
DE2235465B2 (de) 1977-02-10
CH539360A (de) 1973-07-15
DE2235465C3 (de) 1981-04-02
US3810128A (en) 1974-05-07
IL40282A0 (en) 1972-11-28
HU165367B (enExample) 1974-08-28
FR2154538B1 (enExample) 1976-08-13
SE384599B (sv) 1976-05-10
IT967244B (it) 1974-02-28
FR2154538A1 (enExample) 1973-05-11
ES407127A1 (es) 1975-10-16
CA971289A (en) 1975-07-15
IL40282A (en) 1974-12-31
JPS4843589A (enExample) 1973-06-23
DE2235465A1 (de) 1973-04-19
GB1394183A (en) 1975-05-14
NL7209934A (enExample) 1973-04-03

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