JPS5616853A - Surface analysis unit - Google Patents
Surface analysis unitInfo
- Publication number
- JPS5616853A JPS5616853A JP9300979A JP9300979A JPS5616853A JP S5616853 A JPS5616853 A JP S5616853A JP 9300979 A JP9300979 A JP 9300979A JP 9300979 A JP9300979 A JP 9300979A JP S5616853 A JPS5616853 A JP S5616853A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- secondary ions
- primary
- generated
- ions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
PURPOSE:To make it possible to analyze a thin film with a high sensitivity, by irradiating a primary ion beam to a sample and by energy-analyzing back secondary ions emitted from the reverse face of the irradiation point and by performing mass analysis. CONSTITUTION:Primary ions from PIG ion source 1 scan sample surface 5 due to leading-out electrode 2, Einzellens 3 and deflecting electrode 4, and the primary ion quantity passing through sample 5 is monitored by Faraday cage 6. Secondary ions generated from the back face of sample 5 are sent to mask filter 8 by spherical energy analyzer 7, and mass separation of generated secondary ions is performed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9300979A JPS5616853A (en) | 1979-07-20 | 1979-07-20 | Surface analysis unit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9300979A JPS5616853A (en) | 1979-07-20 | 1979-07-20 | Surface analysis unit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5616853A true JPS5616853A (en) | 1981-02-18 |
Family
ID=14070398
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9300979A Pending JPS5616853A (en) | 1979-07-20 | 1979-07-20 | Surface analysis unit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5616853A (en) |
-
1979
- 1979-07-20 JP JP9300979A patent/JPS5616853A/en active Pending
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