JPS56167324A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS56167324A
JPS56167324A JP7056380A JP7056380A JPS56167324A JP S56167324 A JPS56167324 A JP S56167324A JP 7056380 A JP7056380 A JP 7056380A JP 7056380 A JP7056380 A JP 7056380A JP S56167324 A JPS56167324 A JP S56167324A
Authority
JP
Japan
Prior art keywords
oxide film
core tube
diffusion
mask
poly
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7056380A
Other languages
Japanese (ja)
Other versions
JPS6152564B2 (en
Inventor
Masaaki Sadamori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP7056380A priority Critical patent/JPS56167324A/en
Publication of JPS56167324A publication Critical patent/JPS56167324A/en
Publication of JPS6152564B2 publication Critical patent/JPS6152564B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/22Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
    • H01L21/223Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities using diffusion into or out of a solid from or into a gaseous phase

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Formation Of Insulating Films (AREA)

Abstract

PURPOSE:To prevent occurrence of abnormal defect and cracks on an oxide film, in a high-temperature and long-time diffusion treatment process using the oxide film as a mask, by causing a carrier gas to contain oxygen by employing an polycrystalline Si tube for a core tube of a diffusion furnace. CONSTITUTION:Formation of a penetration diffusion layer which is so deep as to penetrate a substrate wafer 1, such as an elements separation diffusion layer 4 in a planar type thyrister, etc., is utilized for a process using an oxide film 2 as a mask. In a process of this type which requires a high temperature and a long time, a tubular body of poly Si is used as a core tube 40 of a diffusion furnace containing the wafer 1. A carrier gas is made to contain 10vol% or more of oxygen and is so conditioned as to allow an SiO2 film to be formed on inside wall surface of the poly Si core tube. It is possible, by doing so, to prevent occurrence of an abnormal defect and crack on the oxide film due to the contamination by an alkali in the process of penetration treatment of boron, etc. to be executed at such a high temperature as 1,200-1,400 deg.C and for such a long time as 30hr or more, and therefore, it becomes possible to improve production yield.
JP7056380A 1980-05-26 1980-05-26 Manufacture of semiconductor device Granted JPS56167324A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7056380A JPS56167324A (en) 1980-05-26 1980-05-26 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7056380A JPS56167324A (en) 1980-05-26 1980-05-26 Manufacture of semiconductor device

Publications (2)

Publication Number Publication Date
JPS56167324A true JPS56167324A (en) 1981-12-23
JPS6152564B2 JPS6152564B2 (en) 1986-11-13

Family

ID=13435124

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7056380A Granted JPS56167324A (en) 1980-05-26 1980-05-26 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS56167324A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09120948A (en) * 1996-09-30 1997-05-06 Hitachi Ltd Wafer support device of semiconductor wafer heat treatment system and semiconductor wafer heat treatment system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09120948A (en) * 1996-09-30 1997-05-06 Hitachi Ltd Wafer support device of semiconductor wafer heat treatment system and semiconductor wafer heat treatment system

Also Published As

Publication number Publication date
JPS6152564B2 (en) 1986-11-13

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