JPS56165452A - Digital multiplex trunk test system - Google Patents
Digital multiplex trunk test systemInfo
- Publication number
- JPS56165452A JPS56165452A JP6975780A JP6975780A JPS56165452A JP S56165452 A JPS56165452 A JP S56165452A JP 6975780 A JP6975780 A JP 6975780A JP 6975780 A JP6975780 A JP 6975780A JP S56165452 A JPS56165452 A JP S56165452A
- Authority
- JP
- Japan
- Prior art keywords
- test
- tste
- dti
- call
- channel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M3/00—Automatic or semi-automatic exchanges
- H04M3/22—Arrangements for supervision, monitoring or testing
- H04M3/24—Arrangements for supervision, monitoring or testing with provision for checking the normal operation
- H04M3/244—Arrangements for supervision, monitoring or testing with provision for checking the normal operation for multiplex systems
Abstract
PURPOSE:To carry out a circuit test without causing damages to other circuits, by branching and inserting the call/control signal relating to a channel that is desingated optionally among the digital multiplex circuits and by giving a by-passing to other channels. CONSTITUTION:Both the time-division switch TDSW side and the transmission line side are led into the side of the DTI test device TSTE simultaneously via test relay contacts t1 and t2 between a device DTI which terminates the digital multiplex circuit to a time-division digital exchange and the multiple transmission line. Then only the call/control signal relating to the channel to be tested is branched and inserted by the device TSTE, and other channels are by-passed to be set to the original places. In case of an outgoing circuit test, the test board outgoing call is branched by the device TSTE to terminate at the DTI(TSTDTI) which is allotted for the test purpose. In case of an incoming circuit test, the test board outgoing call is transmitted from the TSTDTI and inserted into the test channel by the TSTE to terminate at the TSTTRK of own station.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6975780A JPS56165452A (en) | 1980-05-26 | 1980-05-26 | Digital multiplex trunk test system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6975780A JPS56165452A (en) | 1980-05-26 | 1980-05-26 | Digital multiplex trunk test system |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56165452A true JPS56165452A (en) | 1981-12-19 |
Family
ID=13411978
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6975780A Pending JPS56165452A (en) | 1980-05-26 | 1980-05-26 | Digital multiplex trunk test system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56165452A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58164362A (en) * | 1982-03-24 | 1983-09-29 | Fujitsu Ltd | Automatic testing system of trunk |
-
1980
- 1980-05-26 JP JP6975780A patent/JPS56165452A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58164362A (en) * | 1982-03-24 | 1983-09-29 | Fujitsu Ltd | Automatic testing system of trunk |
JPH0224425B2 (en) * | 1982-03-24 | 1990-05-29 | Fujitsu Ltd |
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