JPS56121121A - Clock distribution system - Google Patents
Clock distribution systemInfo
- Publication number
- JPS56121121A JPS56121121A JP2459780A JP2459780A JPS56121121A JP S56121121 A JPS56121121 A JP S56121121A JP 2459780 A JP2459780 A JP 2459780A JP 2459780 A JP2459780 A JP 2459780A JP S56121121 A JPS56121121 A JP S56121121A
- Authority
- JP
- Japan
- Prior art keywords
- clk
- memory element
- package
- memory
- signals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/04—Generating or distributing clock signals or signals derived directly therefrom
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
PURPOSE:To diagnose easily a fault due to a memory element in a package containing a logic circuit and the memory element, by providing clock signals for diagnosis. CONSTITUTION:Package 1a is provided with clock signal CLK for original operation and clock signals CLK-1-CLK-6 for fault diagnosis. Then, signals CLK are distributed to logic circuits 2 and 2a, connected mutually to memory part 4a including the memory element and buffer register, by clock distributor 3 via OR gates 11-16. To make a fault diagnosis of package 1a, signals CLK-1-CLK-6 are distributed similarly to respective parts via gates 11-16. Then, the AC function test of the memory element in memory 4a can be done by properly setting the phases of signals CLK-1-CLK-6. In this way, the fault caused by the memory element can easily be diagnosed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2459780A JPS56121121A (en) | 1980-02-28 | 1980-02-28 | Clock distribution system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2459780A JPS56121121A (en) | 1980-02-28 | 1980-02-28 | Clock distribution system |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56121121A true JPS56121121A (en) | 1981-09-22 |
JPH0135365B2 JPH0135365B2 (en) | 1989-07-25 |
Family
ID=12142555
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2459780A Granted JPS56121121A (en) | 1980-02-28 | 1980-02-28 | Clock distribution system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56121121A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0581144A (en) * | 1991-09-25 | 1993-04-02 | Fujitsu Ltd | Memory card test method |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS495545A (en) * | 1972-05-02 | 1974-01-18 | ||
JPS4925060A (en) * | 1972-04-30 | 1974-03-06 | ||
JPS5490935A (en) * | 1977-11-29 | 1979-07-19 | Fujitsu Ltd | Test method of electronic parts |
-
1980
- 1980-02-28 JP JP2459780A patent/JPS56121121A/en active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4925060A (en) * | 1972-04-30 | 1974-03-06 | ||
JPS495545A (en) * | 1972-05-02 | 1974-01-18 | ||
JPS5490935A (en) * | 1977-11-29 | 1979-07-19 | Fujitsu Ltd | Test method of electronic parts |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0581144A (en) * | 1991-09-25 | 1993-04-02 | Fujitsu Ltd | Memory card test method |
Also Published As
Publication number | Publication date |
---|---|
JPH0135365B2 (en) | 1989-07-25 |
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