JPS56118653A - Contact-type potential difference measuring method for structure of different thickness - Google Patents
Contact-type potential difference measuring method for structure of different thicknessInfo
- Publication number
- JPS56118653A JPS56118653A JP2046780A JP2046780A JPS56118653A JP S56118653 A JPS56118653 A JP S56118653A JP 2046780 A JP2046780 A JP 2046780A JP 2046780 A JP2046780 A JP 2046780A JP S56118653 A JPS56118653 A JP S56118653A
- Authority
- JP
- Japan
- Prior art keywords
- potential difference
- change
- interval
- plate thickness
- power supply
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/041—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
PURPOSE:To make it possible to highly accurately measure the resistivity change of even large- sized parts having change in configuration and plate thickness by a method wherein the measuring terminal interval is more than 0.8 times as much as the power supply terminal interval, and the power supply terminal interval is less than 0.4 times as much as the plate thickness. CONSTITUTION:The interval between the power supply terminals 1 and 2 of an electric resistance measuring circuit according to the four-terminal potential difference method is represented by L, and the interval between the detecting terminals 3 and 4 by l. The relationship between the potential difference output ratio and l/L is as shown in the figure: when l/L is more than 0.8, the potential difference output is substantially saturated, and a high output can be obtained, so that the resistance change can be measured with high sensitivity. On the other hand, if the plate thickness to be measured is represented by (t), the relationship between the output potential difference and L/t is as shown in the figure: when L/t>0.5, only a minute change in plate thickness causes the potential difference value to vary, so that the degree of accuracy largely lowers. Therefore, L/t is should be at least less than 0.4. Thereby, for even large-sized parts, the degree of deterioration due to change with time can be highly accurately measured by using a resistivity change.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2046780A JPS56118653A (en) | 1980-02-22 | 1980-02-22 | Contact-type potential difference measuring method for structure of different thickness |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2046780A JPS56118653A (en) | 1980-02-22 | 1980-02-22 | Contact-type potential difference measuring method for structure of different thickness |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS56118653A true JPS56118653A (en) | 1981-09-17 |
Family
ID=12027890
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2046780A Pending JPS56118653A (en) | 1980-02-22 | 1980-02-22 | Contact-type potential difference measuring method for structure of different thickness |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS56118653A (en) |
-
1980
- 1980-02-22 JP JP2046780A patent/JPS56118653A/en active Pending
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