JPS56115945A - Detecting device for defect of panel plate - Google Patents

Detecting device for defect of panel plate

Info

Publication number
JPS56115945A
JPS56115945A JP1777880A JP1777880A JPS56115945A JP S56115945 A JPS56115945 A JP S56115945A JP 1777880 A JP1777880 A JP 1777880A JP 1777880 A JP1777880 A JP 1777880A JP S56115945 A JPS56115945 A JP S56115945A
Authority
JP
Japan
Prior art keywords
defect
panel plate
back side
light
existing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1777880A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6312249B2 (zh
Inventor
Kensaku Takahashi
Yasuo Hachikake
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi Electronics Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Electronics Engineering Co Ltd filed Critical Hitachi Electronics Engineering Co Ltd
Priority to JP1777880A priority Critical patent/JPS56115945A/ja
Publication of JPS56115945A publication Critical patent/JPS56115945A/ja
Publication of JPS6312249B2 publication Critical patent/JPS6312249B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1777880A 1980-02-18 1980-02-18 Detecting device for defect of panel plate Granted JPS56115945A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1777880A JPS56115945A (en) 1980-02-18 1980-02-18 Detecting device for defect of panel plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1777880A JPS56115945A (en) 1980-02-18 1980-02-18 Detecting device for defect of panel plate

Publications (2)

Publication Number Publication Date
JPS56115945A true JPS56115945A (en) 1981-09-11
JPS6312249B2 JPS6312249B2 (zh) 1988-03-18

Family

ID=11953169

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1777880A Granted JPS56115945A (en) 1980-02-18 1980-02-18 Detecting device for defect of panel plate

Country Status (1)

Country Link
JP (1) JPS56115945A (zh)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5862544A (ja) * 1981-10-09 1983-04-14 Nippon Kogaku Kk <Nikon> 欠陥検査装置
JPS5879144A (ja) * 1981-11-06 1983-05-12 Nippon Kogaku Kk <Nikon> 異物検出装置
JPS6312943A (ja) * 1986-05-02 1988-01-20 パ−テイクル、メジユアリング、システムズ　インコ−ポレ−テツド 表面分析方法および表面分析装置
JPH01151243A (ja) * 1987-12-09 1989-06-14 Mitsui Mining & Smelting Co Ltd 欠陥分布測定法および装置
JPH04143640A (ja) * 1990-07-27 1992-05-18 Hitachi Ltd 異物検査装置
JPH04230837A (ja) * 1991-04-26 1992-08-19 Hitachi Ltd 両面異物検出方法及びその装置
US5331396A (en) * 1991-10-08 1994-07-19 Matsushita Electric Industrial Co., Ltd. Foreign matter detection device
JP2002544477A (ja) * 1999-05-11 2002-12-24 アプライド マテリアルズ インコーポレイテッド ライン光スポットで二次元イメージングを行う検査システム
JP2003086103A (ja) * 2001-09-13 2003-03-20 Matsushita Electric Ind Co Ltd プラズマディスプレイパネルの欠陥検出方法
JP2005180939A (ja) * 2003-12-16 2005-07-07 Lasertec Corp 光学装置、検査装置及び検査方法
JP2019045452A (ja) * 2017-09-07 2019-03-22 株式会社住田光学ガラス 検査装置および検査方法

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5862544A (ja) * 1981-10-09 1983-04-14 Nippon Kogaku Kk <Nikon> 欠陥検査装置
JPH0343581B2 (zh) * 1981-10-09 1991-07-03 Nippon Kogaku Kk
JPS5879144A (ja) * 1981-11-06 1983-05-12 Nippon Kogaku Kk <Nikon> 異物検出装置
JPH0427497B2 (zh) * 1981-11-06 1992-05-12 Nippon Kogaku Kk
JPS6312943A (ja) * 1986-05-02 1988-01-20 パ−テイクル、メジユアリング、システムズ　インコ−ポレ−テツド 表面分析方法および表面分析装置
JPH01151243A (ja) * 1987-12-09 1989-06-14 Mitsui Mining & Smelting Co Ltd 欠陥分布測定法および装置
JPH04143640A (ja) * 1990-07-27 1992-05-18 Hitachi Ltd 異物検査装置
JPH04230837A (ja) * 1991-04-26 1992-08-19 Hitachi Ltd 両面異物検出方法及びその装置
US5331396A (en) * 1991-10-08 1994-07-19 Matsushita Electric Industrial Co., Ltd. Foreign matter detection device
JP2002544477A (ja) * 1999-05-11 2002-12-24 アプライド マテリアルズ インコーポレイテッド ライン光スポットで二次元イメージングを行う検査システム
JP2003086103A (ja) * 2001-09-13 2003-03-20 Matsushita Electric Ind Co Ltd プラズマディスプレイパネルの欠陥検出方法
JP2005180939A (ja) * 2003-12-16 2005-07-07 Lasertec Corp 光学装置、検査装置及び検査方法
JP2019045452A (ja) * 2017-09-07 2019-03-22 株式会社住田光学ガラス 検査装置および検査方法

Also Published As

Publication number Publication date
JPS6312249B2 (zh) 1988-03-18

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