JPS5583855A - Circuit testing probe and circuit test method - Google Patents
Circuit testing probe and circuit test methodInfo
- Publication number
- JPS5583855A JPS5583855A JP15889578A JP15889578A JPS5583855A JP S5583855 A JPS5583855 A JP S5583855A JP 15889578 A JP15889578 A JP 15889578A JP 15889578 A JP15889578 A JP 15889578A JP S5583855 A JPS5583855 A JP S5583855A
- Authority
- JP
- Japan
- Prior art keywords
- probes
- unit
- circuit
- needle
- line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
PURPOSE: To enhance mechanical strength and improve frequency characteristic with a simple constitution by connecting the coaxial cable from a testing unit to a tested part through a strip line and an elastic needle.
CONSTITUTION: In probe main body 1, conductive layer 12 as a high-frequency transmission path and corresponding conductive layer 13 are formed on the surface and the reverse face of dielectric substrate 11 respectively to constitute a strip line, and center conductor 21 of coaxial cable 2 from a testing unit is connected to one end of the line by soldering, and needles 4 and 4' where probes 42 and 42' are fitted are protruded to the other end of the line from main body 1. Probes 7 of the constitution above are provided in testing unit 6, and the part of tested object 5 and the needle are separated from each other, and power is supplied from the external of unit 6 to the electromagnetic solenoid of unit 8 where probes 7 are fitted to press the needle to the test part, thus performing a prescribed test.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15889578A JPS5811026B2 (en) | 1978-12-20 | 1978-12-20 | Circuit test probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15889578A JPS5811026B2 (en) | 1978-12-20 | 1978-12-20 | Circuit test probe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5583855A true JPS5583855A (en) | 1980-06-24 |
| JPS5811026B2 JPS5811026B2 (en) | 1983-03-01 |
Family
ID=15681713
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15889578A Expired JPS5811026B2 (en) | 1978-12-20 | 1978-12-20 | Circuit test probe |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5811026B2 (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6191166U (en) * | 1984-11-19 | 1986-06-13 | ||
| JPS6221068A (en) * | 1985-07-19 | 1987-01-29 | Koichi Yoshida | Flat-type probe |
| JPS6228673A (en) * | 1985-07-31 | 1987-02-06 | Koichi Yoshida | Multiprober |
| US6715345B2 (en) * | 2000-04-20 | 2004-04-06 | Nec Corporation | Coaxial probe with cantilever and scanning micro-wave microscope including the same |
| CN105403826A (en) * | 2016-01-04 | 2016-03-16 | 京东方科技集团股份有限公司 | Test tool |
-
1978
- 1978-12-20 JP JP15889578A patent/JPS5811026B2/en not_active Expired
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6191166U (en) * | 1984-11-19 | 1986-06-13 | ||
| JPS6221068A (en) * | 1985-07-19 | 1987-01-29 | Koichi Yoshida | Flat-type probe |
| JPS6228673A (en) * | 1985-07-31 | 1987-02-06 | Koichi Yoshida | Multiprober |
| US6715345B2 (en) * | 2000-04-20 | 2004-04-06 | Nec Corporation | Coaxial probe with cantilever and scanning micro-wave microscope including the same |
| CN105403826A (en) * | 2016-01-04 | 2016-03-16 | 京东方科技集团股份有限公司 | Test tool |
| US10209272B2 (en) | 2016-01-04 | 2019-02-19 | Boe Technology Group Co., Ltd. | Testing device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5811026B2 (en) | 1983-03-01 |
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