JPS6228673A - Multiprober - Google Patents

Multiprober

Info

Publication number
JPS6228673A
JPS6228673A JP60168789A JP16878985A JPS6228673A JP S6228673 A JPS6228673 A JP S6228673A JP 60168789 A JP60168789 A JP 60168789A JP 16878985 A JP16878985 A JP 16878985A JP S6228673 A JPS6228673 A JP S6228673A
Authority
JP
Japan
Prior art keywords
prober
measured
probe
coaxial cable
contact type
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60168789A
Other languages
Japanese (ja)
Inventor
Koichi Yoshida
光一 吉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP60168789A priority Critical patent/JPS6228673A/en
Publication of JPS6228673A publication Critical patent/JPS6228673A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To make a multiprober contactable with an electrode at the optional position of an object to be measured and, at the same time, removable through an one-touch operation, by providing the alignment mechanism of position and installing a connecting terminal to the main body of the prober. CONSTITUTION:An object 2 to be measured is aligned on an elevating table 7 and the electrode of the object 2 is allowed to contact with a spring-contact type probe 1 by lifting up the table 7. After the alignment of the position, a coaxial cable unit is connected and this prober is put in an extra-low temperature tank and fixed. When high-frequency signals are impressed upon connecting terminals 5c under this condition, the signals are inputted to the object 2 to be measured through coaxial cables 4b and 4a and the probe 1 and output signals from the object 2 are measured by means of a measuring instrument through the probe 1 and cables 4a and 4b without disturbing the waveform.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は複数のスプリング・コンタクト式プローブから
成るマルチプローバ、特に極低温たとえば4”Kにおい
て各種回路基板の電気特性、特に高周波電圧特性の測定
に好適なマルチプローバに関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention is a multi-prober consisting of a plurality of spring contact type probes, and is particularly useful for measuring electrical characteristics, especially high frequency voltage characteristics, of various circuit boards at extremely low temperatures, such as 4"K. The present invention relates to a multi-prober suitable for.

〔従来の技術〕[Conventional technology]

近年、ニューメディア、OA、光通信、半導体などの急
激な技術進歩が行われており、これに伴い所謂[部品と
部品の接点に係る接点技術(コンタクト・テクノロジー
)」並びに[接点を接続する接続技術(コネクション・
テクノロジー)」の高精密化、高性能化が各種新技術に
共通の基礎技術として強く要求されている。具体例とし
て、半Ic・LSI検査システム、中でもプリント基板
やセラミックの多層基板などの各種回路基板の電気特性
、例えば高周波電圧を測定する検査工程において、検査
装置の主要部分を構成するコンタクト式プローブ、特に
スプリング・コンタクト式プローブは、従来上記電気特
性をくずさずに測定するという課題に対して、所謂接点
技術並びに接続技術に係るものであるが、その要求使用
条件、例えば高周波領域での使用条件や超低温から高温
度までの広範囲にわたる温度条件などに十分耐えること
が出来ず、また回路外部からはノイズをひろい、内部か
らノイズを生じる為、その測定結果は要求される精度と
信頼性に欠けがちで、これらの使用条件、環境条件に対
して技術的に十分満足させ得ないという問題があった。
In recent years, rapid technological advances have been made in new media, OA, optical communications, semiconductors, etc., and with this, so-called [contact technology related to contacts between parts] and [connection technology that connects contacts] Technology (connection/
There is a strong demand for higher precision and higher performance of ``technology'' as a basic technology common to various new technologies. As a specific example, contact type probes, which constitute the main part of the inspection equipment, are used in semi-IC/LSI inspection systems, especially in the inspection process that measures the electrical characteristics of various circuit boards such as printed circuit boards and ceramic multilayer boards, such as high frequency voltage. In particular, spring contact type probes are related to so-called contact technology and connection technology to meet the conventional problem of measuring the above-mentioned electrical characteristics without destroying them, but the required usage conditions, such as usage conditions in a high frequency region They cannot sufficiently withstand a wide range of temperature conditions, from extremely low temperatures to high temperatures, and they pick up noise from outside the circuit and generate noise from within, so their measurement results tend to lack the required accuracy and reliability. However, there was a problem in that these usage conditions and environmental conditions could not be fully satisfied technically.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

本発明は上記従来のものの問題点に着目してなされたも
ので、その目的としては超低温たとえば4°Kにおいて
各種回路基板など検査対象物の電気特性をくずさずに高
精度で信頼性の高い測定を可能とした超精密でかつ位置
合せ機構を有し、小型のデユワ装置内でも使用可能なス
プリング・コンタクト式のマルチプローバを提供するこ
とにある。
The present invention has been made by focusing on the problems of the conventional methods described above, and its purpose is to perform highly accurate and reliable measurements at ultra-low temperatures, for example, 4°K, without destroying the electrical characteristics of various circuit boards and other objects to be tested. It is an object of the present invention to provide a spring contact type multi-prober that is ultra-precise and has an alignment mechanism that makes it possible to perform this, and that can be used even in a small dewar device.

さらに詳述すると、本発明の目的はプローブが試験片に
接触する際に、生ずる測定信号の反射を抑制して電気特
性を正確に測定でき、位置合せ機構を有し、プローバ本
体と、この本体と測定装置とワンタッチにて接続可能に
接′17を端子を有する同軸ケーブルユニットに分離し
たことにより、位置合せ調整が容易に行なうことができ
る前述したスプリング・コンタクト式のマルチプローバ
を提供することにある。
More specifically, an object of the present invention is to be able to accurately measure electrical characteristics by suppressing the reflection of measurement signals that occur when a probe comes into contact with a test piece, to have an alignment mechanism, and to have a prober body and a To provide the above-mentioned spring contact type multi-prober in which positioning adjustment can be easily performed by separating the contact 17 into a coaxial cable unit having a terminal that can be connected to a measuring device with one touch. be.

〔問題点を解決するための手段とその作用〕上記目的を
達成するため、本発明は複数のスプリング・コンタクト
式プローブに接続された同軸ケーブルの他端に接続端子
を設け、該複数のスプリング・コンタクト式プローブは
被測定物の近くで一体のパネルにより共通に接地される
ことにより上記プローブと被測定物との接触時に発生す
る例えば入力信号の反射を抑制し、希望したインピーダ
ンス整合を取るようにして波形が乱されずに被測定物の
電気特性を測定でき、またプローバ本体と測定装置とを
接続する同軸ケーブルユニットにはワンタッチにて着脱
できる多極の接続端子を設け、これらはすべて共通のパ
ネルにて接地されるため耐ノイズ性を有し、また、被測
定物の位置合せテーブルを超低温槽たとえば小型のデユ
ワ装置にもプローブと一体で挿入可能にコンパクト化し
たことにより測定の調整を簡単にしたことを要旨とする
[Means for Solving the Problems and Their Effects] In order to achieve the above object, the present invention provides a connection terminal at the other end of the coaxial cable connected to a plurality of spring contact type probes, and Contact type probes are commonly grounded by an integrated panel near the object to be measured, thereby suppressing reflection of the input signal that occurs when the probe and the object to be measured come into contact, and achieving the desired impedance matching. The coaxial cable unit that connects the prober body and the measuring device is equipped with multi-pole connection terminals that can be connected and disconnected with a single touch. It has noise resistance because it is grounded through the panel, and the positioning table for the object to be measured has been made compact so that it can be inserted into a cryogenic chamber, such as a small dewar device, together with the probe, making it easy to adjust measurements. The main points are as follows.

〔発明の実施例〕[Embodiments of the invention]

以下、図面を用いて本発明の詳細な説明する。 Hereinafter, the present invention will be explained in detail using the drawings.

図面は本発明の一実施例を示す斜視図である。まず構成
を説明すると(11はスプリング・コンタクト式プロー
ブで被測定物(2)の電極に接触し、上記プローブ(1
)はプローブパネル(3)にて共通に接地されており′
、上記プローブ(1)の他端部は同軸ケーブル(4a)
と電気的に接続されている。上記同軸ケーブル(4a)
の他端には接続端子(5a)が取り付けられており、こ
れらの端子はすべて共通にコネクタパネル(6a)で接
地されている。上記被測定物(2)は昇降テーブル(7
)に載せられ、これは昇降ツマミ(8)を回転すること
により上下移動される。(9)はブローバ本体を保護す
るバイブであり、この一端には同軸ケーブルユニットと
接続するためのフランジ00)が設けられている。また
、プローバ本体に接続する同軸ケーブルユニットは同軸
ケーブル(4b)の両端に接続端子(5b) 、 (5
c)を有しており、これらはコネクタパネル(6b) 
、 (6c)にて共通に接地されており、接続端子(5
b)は複数の接続端子を同時にワンタッチにて着脱され
る。上記同軸ケーブルユニットは補強パイプ(11)で
保護されており、図示しない超低温槽たとえばデユワ装
置を密閉するゴムせん(12)を有している。
The drawing is a perspective view showing an embodiment of the present invention. First, to explain the configuration (11 is a spring contact type probe that contacts the electrode of the object to be measured (2),
) are commonly grounded at the probe panel (3).
, the other end of the probe (1) is a coaxial cable (4a)
electrically connected to. The above coaxial cable (4a)
A connecting terminal (5a) is attached to the other end, and all these terminals are commonly grounded by a connector panel (6a). The object to be measured (2) is the lifting table (7).
), which is moved up and down by rotating the lift knob (8). (9) is a vibrator that protects the blower body, and one end of the vibrator is provided with a flange 00) for connection to a coaxial cable unit. In addition, the coaxial cable unit connected to the prober body has connection terminals (5b) and (5) at both ends of the coaxial cable (4b).
c) and these are the connector panels (6b)
, (6c) are commonly grounded, and the connecting terminal (5c)
In b), multiple connection terminals can be connected and disconnected simultaneously with one touch. The coaxial cable unit is protected by a reinforcing pipe (11) and has a rubber seal (12) for sealing a cryogenic chamber (not shown), such as a dewar device.

次に、この実施例の作用を説明する。Next, the operation of this embodiment will be explained.

被測定物(2)を昇降テーブル(7)上で位置合せし、
これを上昇することによりスプリング・コンタクト式プ
ローブ(11と上記被測定物(2)の電極とをコンタク
トさせる。位置合せ後、同軸ケーブルユニットを接続し
図示しない超低温槽たとえば、デユワ装置に挿入し固定
する。いま接続端子(5c)に高周波信号が印加される
と、上記同軸ケーブル(4b)。
Align the object to be measured (2) on the lifting table (7),
By raising this, the spring contact type probe (11) and the electrode of the object to be measured (2) are brought into contact. After alignment, the coaxial cable unit is connected and inserted into a cryogenic chamber (not shown), such as a dewar device, and fixed. Now, when a high frequency signal is applied to the connection terminal (5c), the coaxial cable (4b).

(4a)とスプリング・コンタクト式プローブ(11を
経て被測定物(2)に信号が入力され、被測定物(2)
からの出力信号は上記スプリング・コンタクト式プロー
ブ(1)と同軸ケーブル(4a) 、 (4b)を経て
図示しない測定装置により波形が乱されることなく計測
される。
(4a) and the spring contact type probe (11), the signal is input to the object to be measured (2).
The output signal is measured by a measuring device (not shown) through the spring contact type probe (1) and the coaxial cables (4a) and (4b) without disturbing the waveform.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明によれば位置合せ機構を合
せ持つことにより被測定物の任意の位置の電極にコンタ
クト可能となりブローバ本体に接続端子を設けたこと、
しかもワンタッチにて着脱可能としたことにより、小型
化され測定の調整が簡単になるという効果を有し、小型
の超低温槽にも使用できるという実用的効果を存してい
る。またインピーダンス整合に加えて、材質に非磁性体
を用いたことにより信号が乱されず、かつ共通に接地し
たコネクタパネル及びプローブパネルを設けたことによ
り耐ンイズ性を向上し電気特性を高精密に計測を行なう
ことができるという大なる効果を有している。
As explained above, according to the present invention, by combining the positioning mechanism, it is possible to contact the electrode at any position on the object to be measured, and the connecting terminal is provided on the main body of the blower.
Moreover, since it can be attached and detached with a single touch, it has the effect of being compact and easy to adjust measurements, and has the practical effect of being able to be used in small cryogenic chambers. In addition to impedance matching, the use of non-magnetic material prevents signal disturbance, and the provision of a commonly grounded connector panel and probe panel improves noise resistance and provides highly precise electrical characteristics. It has the great effect of being able to perform measurements.

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本発明の一実施例を示すマルチプローバの一部破
断面を含む斜視図である。 (1)・・・スプリング・コンタクト式プローブ(2)
・・・被測定物 (3)・・・プローブパネル (4a) 、 (4b)・・・同軸ケーブル(5a) 
、 (5b) 、 (5c)−接続端子(6a) 、 
(6b) 、 (6c)−コネクタパネル(7)・・・
昇降テーブル 特許出曝人  吉田光−
The drawing is a partially broken perspective view of a multi-prober showing an embodiment of the present invention. (1) Spring contact type probe (2)
...Object to be measured (3)...Probe panel (4a), (4b)...Coaxial cable (5a)
, (5b), (5c)-connection terminal (6a),
(6b), (6c)-Connector panel (7)...
Lifting table patent author Hikaru Yoshida

Claims (5)

【特許請求の範囲】[Claims] (1)複数のスプリング・コンタクト式プローブと、測
定装置への接続端子と、被測定物の位置合せ機構を有す
る本体と、上記本体と測定装置とを接続する複数の接続
端子を有する同軸ケーブルユニットとから構成されたこ
とを特徴とするマルチプローバ。
(1) A coaxial cable unit that has a main body that has a plurality of spring contact type probes, a connection terminal to a measuring device, a mechanism for positioning the object to be measured, and a plurality of connection terminals that connect the main body and the measuring device. A multi-prober comprising:
(2)上記本体と上記測定装置とを接続する上記同軸ケ
ーブルユニットの上記複数の接続端子はそれぞれの中心
導体と外部導体が同時にワンタッチ方式で着脱可能にし
たことを特徴とする特許請求の範囲第1項記載のマルチ
プローバ。
(2) The plurality of connection terminals of the coaxial cable unit that connects the main body and the measurement device are such that the respective center conductors and outer conductors can be attached and detached at the same time in a one-touch manner. The multi-prober described in item 1.
(3)上記スプリング・コンタクト式プローブはプロー
ブパネルにより共通に接地されたことを特徴とする特許
請求の範囲第1項または第2項のいずれかに記載のマル
チプローバ。
(3) The multi-prober according to claim 1 or 2, wherein the spring contact type probes are commonly grounded by a probe panel.
(4)上記接続端子はコネクタパネルにより共通に接地
されたことを特徴とする特許請求の範囲第1項ないし第
3項のいずれかに記載のマルチプローバ。
(4) The multi-prober according to any one of claims 1 to 3, wherein the connection terminals are commonly grounded by a connector panel.
(5)上記マルチプローバはすべて非磁性体にて構成さ
れることを特徴とする上記特許請求の範囲第1項ないし
第4項のいずれかに記載のマルチプローバ。
(5) The multi-prober according to any one of claims 1 to 4, wherein the multi-prober is entirely made of non-magnetic material.
JP60168789A 1985-07-31 1985-07-31 Multiprober Pending JPS6228673A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60168789A JPS6228673A (en) 1985-07-31 1985-07-31 Multiprober

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60168789A JPS6228673A (en) 1985-07-31 1985-07-31 Multiprober

Publications (1)

Publication Number Publication Date
JPS6228673A true JPS6228673A (en) 1987-02-06

Family

ID=15874499

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60168789A Pending JPS6228673A (en) 1985-07-31 1985-07-31 Multiprober

Country Status (1)

Country Link
JP (1) JPS6228673A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012026743A (en) * 2010-07-20 2012-02-09 Hioki Ee Corp Circuit board inspection apparatus
US10766535B2 (en) 2017-07-06 2020-09-08 Honda Motor Co., Ltd. Vehicle body rear part structure

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5583855A (en) * 1978-12-20 1980-06-24 Fujitsu Ltd Circuit testing probe and circuit test method
JPS58175273A (en) * 1982-04-07 1983-10-14 沖電気工業株式会社 Coaxial movable contact probe
JPS6011077B2 (en) * 1980-07-07 1985-03-22 ソシエテ・デ・プロデユイ・ネツスル・ソシエテ・アノニム How to improve coffee oil

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5583855A (en) * 1978-12-20 1980-06-24 Fujitsu Ltd Circuit testing probe and circuit test method
JPS6011077B2 (en) * 1980-07-07 1985-03-22 ソシエテ・デ・プロデユイ・ネツスル・ソシエテ・アノニム How to improve coffee oil
JPS58175273A (en) * 1982-04-07 1983-10-14 沖電気工業株式会社 Coaxial movable contact probe

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012026743A (en) * 2010-07-20 2012-02-09 Hioki Ee Corp Circuit board inspection apparatus
US10766535B2 (en) 2017-07-06 2020-09-08 Honda Motor Co., Ltd. Vehicle body rear part structure

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