JPS5580045A - Deficiency detection system - Google Patents

Deficiency detection system

Info

Publication number
JPS5580045A
JPS5580045A JP15268078A JP15268078A JPS5580045A JP S5580045 A JPS5580045 A JP S5580045A JP 15268078 A JP15268078 A JP 15268078A JP 15268078 A JP15268078 A JP 15268078A JP S5580045 A JPS5580045 A JP S5580045A
Authority
JP
Japan
Prior art keywords
output
comparator
compared
scanning
deficiency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15268078A
Other languages
Japanese (ja)
Inventor
Yoshiaki Arimura
Yutaka Hitomi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP15268078A priority Critical patent/JPS5580045A/en
Publication of JPS5580045A publication Critical patent/JPS5580045A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To improve the deficiency detection accuracy by detecting the reflected light from the work or the speed of changes in the light transmitted. CONSTITUTION:A lamp 3 and a focusing lens 5 and a camera device 7 having a camera element 6 capable of scanning in multiple lines simultaneously are arranged sandwitching the work, for example a glass bottle 1. Parallel outputs of the respeciv tive scanning lines 8a-8f are added with an addition circuit 9 to determine the mean value. The output is compared with a desired scanning line, for example the scanning line 8d by means of a comparator 10, whose outut is delayed by a certain scanning time by a delay circuit 11. Then the output of the circuit 11 is compared with the output of the comparator 10 through a comparator 12, whose output is compared with the threshold through a comparator 18. Then, the output is provided to a position detecting section 19. In this manner, the speed of changes in the light is detected. By this manner, any rapid change is determined to indicate a deficiency thereby preventing misjudgement and ultimately improving the detection accuracy.
JP15268078A 1978-12-12 1978-12-12 Deficiency detection system Pending JPS5580045A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15268078A JPS5580045A (en) 1978-12-12 1978-12-12 Deficiency detection system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15268078A JPS5580045A (en) 1978-12-12 1978-12-12 Deficiency detection system

Publications (1)

Publication Number Publication Date
JPS5580045A true JPS5580045A (en) 1980-06-16

Family

ID=15545757

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15268078A Pending JPS5580045A (en) 1978-12-12 1978-12-12 Deficiency detection system

Country Status (1)

Country Link
JP (1) JPS5580045A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007222765A (en) * 2006-02-23 2007-09-06 Hitachi Koki Co Ltd Rotor for centrifugal separation, and centrifuge

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007222765A (en) * 2006-02-23 2007-09-06 Hitachi Koki Co Ltd Rotor for centrifugal separation, and centrifuge

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