JPS5543420A - Metallic material examination device - Google Patents

Metallic material examination device

Info

Publication number
JPS5543420A
JPS5543420A JP11650078A JP11650078A JPS5543420A JP S5543420 A JPS5543420 A JP S5543420A JP 11650078 A JP11650078 A JP 11650078A JP 11650078 A JP11650078 A JP 11650078A JP S5543420 A JPS5543420 A JP S5543420A
Authority
JP
Japan
Prior art keywords
bridge
sample
metallic material
sensor
examination device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11650078A
Other languages
Japanese (ja)
Inventor
Hiroshi Uno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Saginomiya Seisakusho Inc
Original Assignee
Saginomiya Seisakusho Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Saginomiya Seisakusho Inc filed Critical Saginomiya Seisakusho Inc
Priority to JP11650078A priority Critical patent/JPS5543420A/en
Publication of JPS5543420A publication Critical patent/JPS5543420A/en
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

PURPOSE: To know the data comprising a real number and an imaginary number of the unbalanced output as vector quantity by using a bridge including a coil sensor.
CONSTITUTION: When the coil sensor 2 forming the bridge 3 is contacted with the conductive metalic sample 1 to be measured, impedance of the coils L1, L2 changes owing to the eddy current. The unbalanced portion of the bridge 3 is demodulated as the real number portion and the imaginary number portion by the synchronous detectors 6 and 7 and operated 10, 11 through LPF 8, 9 to obtain the vector length signal and the angle signal. When the sensor 2 is stably contacted with the sample and the switch SW1 is turned ON, the vector length signal and the angle signal can be respectively to the display unit 14, 15.
COPYRIGHT: (C)1980,JPO&Japio
JP11650078A 1978-09-25 1978-09-25 Metallic material examination device Pending JPS5543420A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11650078A JPS5543420A (en) 1978-09-25 1978-09-25 Metallic material examination device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11650078A JPS5543420A (en) 1978-09-25 1978-09-25 Metallic material examination device

Publications (1)

Publication Number Publication Date
JPS5543420A true JPS5543420A (en) 1980-03-27

Family

ID=14688662

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11650078A Pending JPS5543420A (en) 1978-09-25 1978-09-25 Metallic material examination device

Country Status (1)

Country Link
JP (1) JPS5543420A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56130652A (en) * 1980-03-18 1981-10-13 Anritsu Corp Metal discriminating device
US4364012A (en) * 1980-03-03 1982-12-14 The Board Of Trustees Of The Leland Stanford Junior University FMR Probe method utilizing main and spurious resonance modes for detecting surface flaws
JPS61187647A (en) * 1985-02-15 1986-08-21 Nippon Kokan Kk <Nkk> Apparatus for measuring silicon content
JP2011064590A (en) * 2009-09-17 2011-03-31 Ebara Corp Eddy current sensor, polishing apparatus, plating apparatus, polishing method, plating method
JP2019015655A (en) * 2017-07-10 2019-01-31 国立研究開発法人物質・材料研究機構 Metal bars corrosion detection system, and metal bars corrosion detection method

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4364012A (en) * 1980-03-03 1982-12-14 The Board Of Trustees Of The Leland Stanford Junior University FMR Probe method utilizing main and spurious resonance modes for detecting surface flaws
JPS56130652A (en) * 1980-03-18 1981-10-13 Anritsu Corp Metal discriminating device
JPH0322585B2 (en) * 1980-03-18 1991-03-27 Anritsu Corp
JPS61187647A (en) * 1985-02-15 1986-08-21 Nippon Kokan Kk <Nkk> Apparatus for measuring silicon content
JP2011064590A (en) * 2009-09-17 2011-03-31 Ebara Corp Eddy current sensor, polishing apparatus, plating apparatus, polishing method, plating method
JP2019015655A (en) * 2017-07-10 2019-01-31 国立研究開発法人物質・材料研究機構 Metal bars corrosion detection system, and metal bars corrosion detection method

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