JPS55163437A - Gas analyzing unit - Google Patents

Gas analyzing unit

Info

Publication number
JPS55163437A
JPS55163437A JP7121079A JP7121079A JPS55163437A JP S55163437 A JPS55163437 A JP S55163437A JP 7121079 A JP7121079 A JP 7121079A JP 7121079 A JP7121079 A JP 7121079A JP S55163437 A JPS55163437 A JP S55163437A
Authority
JP
Japan
Prior art keywords
gas
moisture
gaseous phase
moisture remover
semipermeable film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7121079A
Other languages
Japanese (ja)
Other versions
JPS6010256B2 (en
Inventor
Teruo Kaneko
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP54071210A priority Critical patent/JPS6010256B2/en
Publication of JPS55163437A publication Critical patent/JPS55163437A/en
Publication of JPS6010256B2 publication Critical patent/JPS6010256B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To equalize the respective gas dew point temperature at both moisture remover outlets by a method wherein as to two semipermeable film gaseous phase moisture removers, the sample gas, which is exhausted from one moisture remover outlet, is reciprocally used as the other moisture remover purging dry gas. CONSTITUTION:The gas, which has been deprived of moisture by a semipermeable film gaseous phase moisture remover, sucked by a pump 13, entered a cell 15A in an infrared gas analyzer 15 through a way in a and a way out b of the change-over valve 14 and got out of said cell 15A, is supplied to the opposite side semipermeable film gaseous phase moisture remover 12a as purging dry gas through an air diffusion tube 17 and further through the way in a, way out b in the change-over valve 18. Similarly the gas, which has been depribed of moisture by the semipermeable film gaseous phase moisture remover 12a, sucked by the pump 13a and passed through the cell 15B, is supplied to the semipermeable film gaseous phase moisture remover 12 as purging dry gas.
JP54071210A 1979-06-08 1979-06-08 gas analyzer Expired JPS6010256B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP54071210A JPS6010256B2 (en) 1979-06-08 1979-06-08 gas analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP54071210A JPS6010256B2 (en) 1979-06-08 1979-06-08 gas analyzer

Publications (2)

Publication Number Publication Date
JPS55163437A true JPS55163437A (en) 1980-12-19
JPS6010256B2 JPS6010256B2 (en) 1985-03-15

Family

ID=13454083

Family Applications (1)

Application Number Title Priority Date Filing Date
JP54071210A Expired JPS6010256B2 (en) 1979-06-08 1979-06-08 gas analyzer

Country Status (1)

Country Link
JP (1) JPS6010256B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58116340A (en) * 1981-12-23 1983-07-11 ガンブロゥ・エングストリヨム・アクツイエボラグ Method and apparatus for measuring definite component in gas inhaled by and/or discharged from patient
JPS6370056U (en) * 1986-10-25 1988-05-11
JPS6435245A (en) * 1987-07-30 1989-02-06 Shimadzu Corp Infrared ray gas analyzer
JPH0732545U (en) * 1994-10-29 1995-06-16 株式会社堀場製作所 Sampling device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58116340A (en) * 1981-12-23 1983-07-11 ガンブロゥ・エングストリヨム・アクツイエボラグ Method and apparatus for measuring definite component in gas inhaled by and/or discharged from patient
JPS6370056U (en) * 1986-10-25 1988-05-11
JPH0548119Y2 (en) * 1986-10-25 1993-12-20
JPS6435245A (en) * 1987-07-30 1989-02-06 Shimadzu Corp Infrared ray gas analyzer
JPH0732545U (en) * 1994-10-29 1995-06-16 株式会社堀場製作所 Sampling device

Also Published As

Publication number Publication date
JPS6010256B2 (en) 1985-03-15

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