JPS55159556A - Mass analyzer - Google Patents
Mass analyzerInfo
- Publication number
- JPS55159556A JPS55159556A JP6767779A JP6767779A JPS55159556A JP S55159556 A JPS55159556 A JP S55159556A JP 6767779 A JP6767779 A JP 6767779A JP 6767779 A JP6767779 A JP 6767779A JP S55159556 A JPS55159556 A JP S55159556A
- Authority
- JP
- Japan
- Prior art keywords
- face
- electric field
- converged
- mass
- field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/22—Electrostatic deflection
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
PURPOSE:To eliminate the influence due to overlapped field in the proximity of border between magnetic and electric fields, by departing the electric field from the magnetic field without sacrifice of the convergency of uniform electric field. CONSTITUTION:An ion beam I is converged through a lens 2 and injected vertically through point O on end face alpha of magnetic field B. In the magnetic field B the ion is rotated with radius corresponding to the number of mass and dispersed, then it is forcused and projected in parallel from end face beta. Then it enters into an electric field E crossing perpendicularly with the beam. Thereafter the ions I1-I3 separated in accordance with the number of mass and projected in parallel from end face beta move parabolically under uniform electric field E to be converged on end face S. Said converged ion beam is caught and detected by a collector C through a collector slit CS arranged on the end face S. When sweeping the strength of the electric field E properly, mass specter can be obtained on the collector C.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6767779A JPS55159556A (en) | 1979-05-31 | 1979-05-31 | Mass analyzer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6767779A JPS55159556A (en) | 1979-05-31 | 1979-05-31 | Mass analyzer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55159556A true JPS55159556A (en) | 1980-12-11 |
Family
ID=13351858
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6767779A Pending JPS55159556A (en) | 1979-05-31 | 1979-05-31 | Mass analyzer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55159556A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6113543A (en) * | 1984-06-27 | 1986-01-21 | Shimadzu Corp | Analysis tube for helium leak detector |
JPH03504780A (en) * | 1988-06-01 | 1991-10-17 | マイクロマス・リミテッド | variable dispersion mass spectrometer |
-
1979
- 1979-05-31 JP JP6767779A patent/JPS55159556A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6113543A (en) * | 1984-06-27 | 1986-01-21 | Shimadzu Corp | Analysis tube for helium leak detector |
JPH03504780A (en) * | 1988-06-01 | 1991-10-17 | マイクロマス・リミテッド | variable dispersion mass spectrometer |
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