JPS55155270A - Number hole reading system for thermoluminescent ray quantity measuring instrument - Google Patents

Number hole reading system for thermoluminescent ray quantity measuring instrument

Info

Publication number
JPS55155270A
JPS55155270A JP6366679A JP6366679A JPS55155270A JP S55155270 A JPS55155270 A JP S55155270A JP 6366679 A JP6366679 A JP 6366679A JP 6366679 A JP6366679 A JP 6366679A JP S55155270 A JPS55155270 A JP S55155270A
Authority
JP
Japan
Prior art keywords
hole
thermoluminescent
number hole
coincide
reading
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6366679A
Other languages
Japanese (ja)
Inventor
Kazutoyo Hirozawa
Toru Yokoe
Katsuhiko Miyagawa
Yoshiaki Hasegawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP6366679A priority Critical patent/JPS55155270A/en
Publication of JPS55155270A publication Critical patent/JPS55155270A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To make automatic measurement sequence smooth, by optically reading the identification number of a thermoluminescent ray meter element to judge on the basis of a threshold voltage whether the reading is proper and by comparing the number with corresponding data in a memory to check whether they coincide with each other.
CONSTITUTION: The number hole of a check plate 25 corresponding to one of thermoluminescent ray meter elements 8, which are sequentially selected, is optically read by two photosensors 18, 19 which constitute an array. The read number hole is compared with a threshole voltage by comparators 31, 32. If the number hole is not lower than the threshold voltage, it is judged that the reading is properly effected. At that time, the number hole is compared with the through hole number of the corresponding meter element 8 stored in a fixed number pattern memory 34 through a buffer memory 33. When they coincide with each other, sequence control is performed through a controller 36. When they do not coincide with each other, retrial or the like is effected through the controller. As a result, automatic measurement sequence is smoothly executed without being affected by the degree of accuracy of number hole position and the scattering in the accuracy of parts, and it is judged whether wrong drilling is performed or a reader is defective.
COPYRIGHT: (C)1980,JPO&Japio
JP6366679A 1979-05-23 1979-05-23 Number hole reading system for thermoluminescent ray quantity measuring instrument Pending JPS55155270A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6366679A JPS55155270A (en) 1979-05-23 1979-05-23 Number hole reading system for thermoluminescent ray quantity measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6366679A JPS55155270A (en) 1979-05-23 1979-05-23 Number hole reading system for thermoluminescent ray quantity measuring instrument

Publications (1)

Publication Number Publication Date
JPS55155270A true JPS55155270A (en) 1980-12-03

Family

ID=13235885

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6366679A Pending JPS55155270A (en) 1979-05-23 1979-05-23 Number hole reading system for thermoluminescent ray quantity measuring instrument

Country Status (1)

Country Link
JP (1) JPS55155270A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8242464B1 (en) * 2007-10-12 2012-08-14 Patel Gordhanbhai N Device and a process for mass monitoring of radiation exposure

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8242464B1 (en) * 2007-10-12 2012-08-14 Patel Gordhanbhai N Device and a process for mass monitoring of radiation exposure

Similar Documents

Publication Publication Date Title
EP1008936A3 (en) Flash memory control method
EP0811945A3 (en) IC card, IC card system, and IC for IC card
ATE77891T1 (en) PIN CHECK TIME DETERMINATION MEANS COMPREHENSIVE SMART CARD IDENTIFICATION SYSTEM.
DE69028209D1 (en) METHOD AND DEVICE FOR CHECKING MONEY FOR MONEY
US4845690A (en) Multiple screen ballistic chronograph
EP0193210A3 (en) Semiconductor memory device with a built-in test circuit
ATE114910T1 (en) METHOD AND DEVICE FOR THE QUANTIZED FLOW CALCULATION OF VIRTUAL CONNECTIONS OVER AN ASYNCHRONOUS TIME-MULTIPLEX TRANSMISSION PATH.
JPS55155270A (en) Number hole reading system for thermoluminescent ray quantity measuring instrument
JPS57203298A (en) Semiconductor storage device
JPS57105814A (en) Error correction processing system for magnetic disc device
DE59203319D1 (en) CONTROL SYSTEM FOR OFFICE MACHINES, IN PARTICULAR COPYERS, OR THE LIKE.
JPS5613585A (en) Semiconductor memory circuit
JPS55163697A (en) Memory device
JPS5694598A (en) Memory error correction control system
JPS5320823A (en) Memory unit test system
JPS5692476A (en) Measuring device of ic
JPS5721000A (en) Memory measuring device
JPS57162189A (en) Testing method for memory device
JPS5754874A (en) Ic tester
SU1647622A1 (en) Memory training device
DE69804002D1 (en) METHOD AND DEVICE FOR MEASURING AND REGISTERING STATISTICAL TIME CHANGES FOR AN OPTICAL DATA CARRIER
JPS55138666A (en) Ic testing apparatus
JPS6135308A (en) Position detecting device
JPS5537634A (en) Integrated-circuit device
JPS6421672A (en) Pattern flaw inspection device