JPS55149892A - Gas flow counter - Google Patents

Gas flow counter

Info

Publication number
JPS55149892A
JPS55149892A JP5786179A JP5786179A JPS55149892A JP S55149892 A JPS55149892 A JP S55149892A JP 5786179 A JP5786179 A JP 5786179A JP 5786179 A JP5786179 A JP 5786179A JP S55149892 A JPS55149892 A JP S55149892A
Authority
JP
Japan
Prior art keywords
gas
metal layer
window film
film
radiation incidence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5786179A
Other languages
Japanese (ja)
Other versions
JPS6042427B2 (en
Inventor
Mikihiko Matsuda
Koichi Harashima
Toshiaki Takechi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP5786179A priority Critical patent/JPS6042427B2/en
Publication of JPS55149892A publication Critical patent/JPS55149892A/en
Publication of JPS6042427B2 publication Critical patent/JPS6042427B2/en
Expired legal-status Critical Current

Links

Abstract

PURPOSE: To obtain a sufficiently stable plateau effect even when Q gas is used by forming a metal layer of gold or nickel on the radiation incidence window film.
CONSTITUTION: The metal layer 10 of gold or nickel is evaporated onto the surface, which will come in contact with a counting gas that flows in the container, of the thin film 9 made of organic compound such as polyethylene terephtalate or the like in order to obtain the radiation incidence window film 2. Since the thin metal layer 10 is evaporated onto the surface of the window film 2, the film 2 has conductivity and the metal layer provides a stable plateau characteristic even when Q gas is used for the counting gas. When the radiation incidence window film 2 is used by fixing itself to the upper part of the container as before, a sufficiently stable plateau characteristic can be obtained even when Q gas is used for the counting gas.
COPYRIGHT: (C)1980,JPO&Japio
JP5786179A 1979-05-11 1979-05-11 gas flow counter Expired JPS6042427B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5786179A JPS6042427B2 (en) 1979-05-11 1979-05-11 gas flow counter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5786179A JPS6042427B2 (en) 1979-05-11 1979-05-11 gas flow counter

Publications (2)

Publication Number Publication Date
JPS55149892A true JPS55149892A (en) 1980-11-21
JPS6042427B2 JPS6042427B2 (en) 1985-09-21

Family

ID=13067768

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5786179A Expired JPS6042427B2 (en) 1979-05-11 1979-05-11 gas flow counter

Country Status (1)

Country Link
JP (1) JPS6042427B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6166356A (en) * 1984-09-07 1986-04-05 Riken Keiki Kk Ion chamber for radiation detecting device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0196239U (en) * 1987-12-09 1989-06-26

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6166356A (en) * 1984-09-07 1986-04-05 Riken Keiki Kk Ion chamber for radiation detecting device

Also Published As

Publication number Publication date
JPS6042427B2 (en) 1985-09-21

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