JPS55149886A - Automatic testing device - Google Patents

Automatic testing device

Info

Publication number
JPS55149886A
JPS55149886A JP5781779A JP5781779A JPS55149886A JP S55149886 A JPS55149886 A JP S55149886A JP 5781779 A JP5781779 A JP 5781779A JP 5781779 A JP5781779 A JP 5781779A JP S55149886 A JPS55149886 A JP S55149886A
Authority
JP
Japan
Prior art keywords
measured
arithmetic processing
testing device
test signal
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5781779A
Other languages
Japanese (ja)
Inventor
Taketoshi Tomita
Kuniaki Anzai
Kazuji Tateishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP5781779A priority Critical patent/JPS55149886A/en
Priority to US06/224,310 priority patent/US4384334A/en
Priority to DE2953597A priority patent/DE2953597C1/en
Priority to DE2953596T priority patent/DE2953596C2/en
Priority to US06/224,282 priority patent/US4348276A/en
Priority to GB8028024A priority patent/GB2061529B/en
Priority to PCT/JP1979/000173 priority patent/WO1980002461A1/en
Priority to DE792953597T priority patent/DE2953597A1/en
Priority to GB8028025A priority patent/GB2062895B/en
Priority to PCT/JP1979/000172 priority patent/WO1980002492A1/en
Publication of JPS55149886A publication Critical patent/JPS55149886A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE: To improve the reliability of a measurement by making plural contact pins contact with a wired substrate automatically and by testing whether an element of the desired value is present at the desired position by means of an automatic microprogram processing.
CONSTITUTION: The automatic testing device consists of the arithmetic processing part A, test signal part B, changeover part C and unit bed D. The arithmetic processing part A controls the device in accordance with a program. The test signal part B sends both a read value and a decided data to the arithmetic processing part. The changeover part C selects an optimum reference resistance for an element to be measured in the substrate to be measured. The unit bed D supports a unit to be measured.
COPYRIGHT: (C)1980,JPO&Japio
JP5781779A 1979-05-08 1979-05-11 Automatic testing device Pending JPS55149886A (en)

Priority Applications (10)

Application Number Priority Date Filing Date Title
JP5781779A JPS55149886A (en) 1979-05-11 1979-05-11 Automatic testing device
US06/224,310 US4384334A (en) 1979-05-08 1979-06-30 Apparatus for driving pulse motors for automatically adjusting external circuits
DE2953597A DE2953597C1 (en) 1979-05-08 1979-06-30 Device for controlling stepper motors in an automatic test device
DE2953596T DE2953596C2 (en) 1979-05-08 1979-06-30 Testing device for the automatic testing of circuit boards
US06/224,282 US4348276A (en) 1979-05-08 1979-06-30 Automatic testing apparatus for automatically testing a printed circuit board
GB8028024A GB2061529B (en) 1979-05-08 1979-06-30 Automatic testing system for printed circuit boards
PCT/JP1979/000173 WO1980002461A1 (en) 1979-05-08 1979-06-30 Automatic testing system for printed circuit boards
DE792953597T DE2953597A1 (en) 1979-05-08 1979-06-30 PULSE MOTOR DRIVING APPARATUS FOR AUTOMATIC TESTING SYSTEM
GB8028025A GB2062895B (en) 1979-05-08 1979-06-30 Pulse motor driving apparatus for automatic testing system
PCT/JP1979/000172 WO1980002492A1 (en) 1979-05-08 1979-06-30 Pulse motor driving apparatus for automatic testing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5781779A JPS55149886A (en) 1979-05-11 1979-05-11 Automatic testing device

Publications (1)

Publication Number Publication Date
JPS55149886A true JPS55149886A (en) 1980-11-21

Family

ID=13066465

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5781779A Pending JPS55149886A (en) 1979-05-08 1979-05-11 Automatic testing device

Country Status (1)

Country Link
JP (1) JPS55149886A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6195258A (en) * 1984-10-16 1986-05-14 Sanyo Electric Co Ltd Apparatus for testing integrated circuit
JPH0552776U (en) * 1991-04-05 1993-07-13 中央電子システム株式会社 Blind board inspection jig

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5013080A (en) * 1973-04-07 1975-02-10

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5013080A (en) * 1973-04-07 1975-02-10

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6195258A (en) * 1984-10-16 1986-05-14 Sanyo Electric Co Ltd Apparatus for testing integrated circuit
JPH0552776U (en) * 1991-04-05 1993-07-13 中央電子システム株式会社 Blind board inspection jig

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