JPS55138250A - Position detector - Google Patents

Position detector

Info

Publication number
JPS55138250A
JPS55138250A JP4466179A JP4466179A JPS55138250A JP S55138250 A JPS55138250 A JP S55138250A JP 4466179 A JP4466179 A JP 4466179A JP 4466179 A JP4466179 A JP 4466179A JP S55138250 A JPS55138250 A JP S55138250A
Authority
JP
Japan
Prior art keywords
pellet
coordinates
electrode
central
connection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4466179A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6215909B2 (enrdf_load_stackoverflow
Inventor
Masayuki Naruse
Koichi Kawada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP4466179A priority Critical patent/JPS55138250A/ja
Publication of JPS55138250A publication Critical patent/JPS55138250A/ja
Publication of JPS6215909B2 publication Critical patent/JPS6215909B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • H01L21/681—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Control Of Position Or Direction (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Input (AREA)
  • Image Processing (AREA)
  • Wire Bonding (AREA)
JP4466179A 1979-04-12 1979-04-12 Position detector Granted JPS55138250A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4466179A JPS55138250A (en) 1979-04-12 1979-04-12 Position detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4466179A JPS55138250A (en) 1979-04-12 1979-04-12 Position detector

Publications (2)

Publication Number Publication Date
JPS55138250A true JPS55138250A (en) 1980-10-28
JPS6215909B2 JPS6215909B2 (enrdf_load_stackoverflow) 1987-04-09

Family

ID=12697621

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4466179A Granted JPS55138250A (en) 1979-04-12 1979-04-12 Position detector

Country Status (1)

Country Link
JP (1) JPS55138250A (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5935892A (ja) * 1982-08-20 1984-02-27 Nec Corp レ−ザ加工装置
JPS62239040A (ja) * 1986-04-11 1987-10-19 Tokyo Electron Ltd 電子部品の取り付け状態検査方式
JPH0468531U (enrdf_load_stackoverflow) * 1990-10-24 1992-06-17
US7206097B2 (en) 2002-05-09 2007-04-17 Dainippon Screen Mfg. Co., Ltd. Patch measurement device and printing apparatus incorporating the same
WO2018042590A1 (ja) * 2016-09-01 2018-03-08 富士機械製造株式会社 部品実装装置および位置認識方法

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5935892A (ja) * 1982-08-20 1984-02-27 Nec Corp レ−ザ加工装置
JPS62239040A (ja) * 1986-04-11 1987-10-19 Tokyo Electron Ltd 電子部品の取り付け状態検査方式
JPH0468531U (enrdf_load_stackoverflow) * 1990-10-24 1992-06-17
US7206097B2 (en) 2002-05-09 2007-04-17 Dainippon Screen Mfg. Co., Ltd. Patch measurement device and printing apparatus incorporating the same
WO2018042590A1 (ja) * 2016-09-01 2018-03-08 富士機械製造株式会社 部品実装装置および位置認識方法
JPWO2018042590A1 (ja) * 2016-09-01 2019-06-24 株式会社Ｆｕｊｉ 部品実装装置および位置認識方法

Also Published As

Publication number Publication date
JPS6215909B2 (enrdf_load_stackoverflow) 1987-04-09

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