JPS5512431A - Pattern meter - Google Patents
Pattern meterInfo
- Publication number
- JPS5512431A JPS5512431A JP8479078A JP8479078A JPS5512431A JP S5512431 A JPS5512431 A JP S5512431A JP 8479078 A JP8479078 A JP 8479078A JP 8479078 A JP8479078 A JP 8479078A JP S5512431 A JPS5512431 A JP S5512431A
- Authority
- JP
- Japan
- Prior art keywords
- patterns
- computer
- signals
- extracted
- converted
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Image Analysis (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8479078A JPS5512431A (en) | 1978-07-11 | 1978-07-11 | Pattern meter |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8479078A JPS5512431A (en) | 1978-07-11 | 1978-07-11 | Pattern meter |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5512431A true JPS5512431A (en) | 1980-01-29 |
Family
ID=13840485
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8479078A Pending JPS5512431A (en) | 1978-07-11 | 1978-07-11 | Pattern meter |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5512431A (ja) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57131008A (en) * | 1981-02-05 | 1982-08-13 | Toppan Printing Co Ltd | Tester for printed matter |
JPS59136873A (ja) * | 1983-01-26 | 1984-08-06 | Hitachi Denshi Ltd | パタ−ン認識装置 |
US4562593A (en) * | 1982-03-08 | 1985-12-31 | Mitsubishi Rayon Co., Ltd. | Method for determination of percentage T cell content of lymphocyte |
JPS6182107A (ja) * | 1984-06-28 | 1986-04-25 | ケイエルエイ・インストラメンツ・コ−ポレ−シヨン | 光学的欠陥検査装置 |
JPH06295341A (ja) * | 1994-03-18 | 1994-10-21 | Nec Corp | エッジ座標検出装置 |
-
1978
- 1978-07-11 JP JP8479078A patent/JPS5512431A/ja active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57131008A (en) * | 1981-02-05 | 1982-08-13 | Toppan Printing Co Ltd | Tester for printed matter |
US4562593A (en) * | 1982-03-08 | 1985-12-31 | Mitsubishi Rayon Co., Ltd. | Method for determination of percentage T cell content of lymphocyte |
JPS59136873A (ja) * | 1983-01-26 | 1984-08-06 | Hitachi Denshi Ltd | パタ−ン認識装置 |
JPS6182107A (ja) * | 1984-06-28 | 1986-04-25 | ケイエルエイ・インストラメンツ・コ−ポレ−シヨン | 光学的欠陥検査装置 |
JPH06295341A (ja) * | 1994-03-18 | 1994-10-21 | Nec Corp | エッジ座標検出装置 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS57132015A (en) | Coordinate transformation device | |
JPS5578352A (en) | Program check system | |
JPS5512431A (en) | Pattern meter | |
JPS5528644A (en) | Memory unit | |
JPS54112629A (en) | Exposure control value display device | |
JPS54154230A (en) | Memory unit | |
JPS5574667A (en) | Pattern discrimination method | |
JPS55125423A (en) | Electronic apparatus with thermometer fitted | |
JPS5341941A (en) | Pattern reading device | |
JPS55163697A (en) | Memory device | |
JPS5591042A (en) | Calculating device | |
JPS5328350A (en) | Rerformance data collection/control system | |
JPS5383729A (en) | Board key output detector for electronic insturment | |
JPS55128128A (en) | Measured data indicator | |
JPS5550210A (en) | Telescope with distance measuring device | |
JPS5585231A (en) | Digital thermometer | |
Braggins | Image analysis lessons for machine vision. | |
JPS5497463A (en) | Variable scale display device | |
JPS5473068A (en) | Data processing unit | |
JPS5396645A (en) | Maintenance system of control unit containing digital computer | |
JPS5483480A (en) | Processing mehtod of wave height distribution analytical data | |
JPS52152257A (en) | Electronic measuring apparatus | |
JPS5611560A (en) | Designation system of specific area | |
JPS54112661A (en) | Process measuring apparatus | |
REBENSBURG et al. | The employment of microcomputers in materials testing. I- System analysis and selection of microprocessors for measurement, control, and evaluation problems |