JPS55110069A - Semiconductor memory device - Google Patents
Semiconductor memory deviceInfo
- Publication number
- JPS55110069A JPS55110069A JP1615879A JP1615879A JPS55110069A JP S55110069 A JPS55110069 A JP S55110069A JP 1615879 A JP1615879 A JP 1615879A JP 1615879 A JP1615879 A JP 1615879A JP S55110069 A JPS55110069 A JP S55110069A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- resistance
- control
- type
- layers
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/0605—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits made of compound material, e.g. AIIIBV
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Abstract
PURPOSE:To feedback the output voltage of one inverter to the other, between a pair of inverters constituting an FF-type memory cell, and control the resistance of the other to an optimum value by the voltage fed back. CONSTITUTION:Load resistances R1', R2' are formed of controllable poly-Si. n- layer 1A for control electrode use is formed on p-type Si substrate 1. Via insulating film 1B, p-type poly-Si layer 1C for resistance use is formed, and also p<+>-layers S1, S2 and n<+>-layers T1, T2 are formed on both ends. Layer T1 is connected to potential point VM, layer T2 to potential source VCC, and n-layer 1A to potential point VN. The value of resistance R1' is almost determined by the concentration of p-layer 1C, and this can be considered as a p channel MOSFET, with drain S1(VM), source S2(VCC), and gat 1A(VN). R2' is formed in a similar manner. By this structure, control is exercised in such a way that power consumption is reduced by increasing resistances R1, R2 and the loss of information load due to leakage by decreasing them. Further, the effect of variation in R1' R2' is reduced by the resistance value control effected by the feedback electric field, so that stability is improved.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1615879A JPS55110069A (en) | 1979-02-16 | 1979-02-16 | Semiconductor memory device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1615879A JPS55110069A (en) | 1979-02-16 | 1979-02-16 | Semiconductor memory device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55110069A true JPS55110069A (en) | 1980-08-25 |
JPS611900B2 JPS611900B2 (en) | 1986-01-21 |
Family
ID=11908689
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1615879A Granted JPS55110069A (en) | 1979-02-16 | 1979-02-16 | Semiconductor memory device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55110069A (en) |
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5674955A (en) * | 1979-11-22 | 1981-06-20 | Toshiba Corp | Semiconductor device |
JPS59104171A (en) * | 1982-12-06 | 1984-06-15 | Seiko Epson Corp | Semiconductor device |
JPH022661A (en) * | 1988-06-17 | 1990-01-08 | Nippon Telegr & Teleph Corp <Ntt> | Semiconductor integrated circuit device and manufacture thereof |
JPH0214566A (en) * | 1989-04-10 | 1990-01-18 | Seiko Epson Corp | Cmos memory cell |
JPH0214565A (en) * | 1989-04-10 | 1990-01-18 | Seiko Epson Corp | Cmos memory cell |
JPH0221655A (en) * | 1989-04-10 | 1990-01-24 | Seiko Epson Corp | Cmos memory cell |
JPH04211166A (en) * | 1991-01-28 | 1992-08-03 | Seiko Epson Corp | Semiconductor device |
JPH0669458A (en) * | 1992-02-24 | 1994-03-11 | Seiko Epson Corp | Memory cell |
JPH0677436A (en) * | 1992-02-24 | 1994-03-18 | Seiko Epson Corp | Random access memory |
US5298764A (en) * | 1991-03-08 | 1994-03-29 | Hitachi, Ltd. | Semiconductor memory device having a field effect transistor with a channel formed from a polycrystalline silicon film |
JPH06227424A (en) * | 1991-06-03 | 1994-08-16 | Norin Suisansyo Shikoku Nogyo Shikenjo | Tractor |
US5536951A (en) * | 1993-06-24 | 1996-07-16 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device having thin film transistor with diffusion preventing layer |
US5770892A (en) * | 1989-01-18 | 1998-06-23 | Sgs-Thomson Microelectronics, Inc. | Field effect device with polycrystalline silicon channel |
EP0877425A2 (en) * | 1990-05-31 | 1998-11-11 | STMicroelectronics, Inc. | Field effect device with polycrystalline silicon channel |
-
1979
- 1979-02-16 JP JP1615879A patent/JPS55110069A/en active Granted
Cited By (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5674955A (en) * | 1979-11-22 | 1981-06-20 | Toshiba Corp | Semiconductor device |
JPH0454978B2 (en) * | 1982-12-06 | 1992-09-01 | Seiko Epson Corp | |
JPS59104171A (en) * | 1982-12-06 | 1984-06-15 | Seiko Epson Corp | Semiconductor device |
JPH022661A (en) * | 1988-06-17 | 1990-01-08 | Nippon Telegr & Teleph Corp <Ntt> | Semiconductor integrated circuit device and manufacture thereof |
US5770892A (en) * | 1989-01-18 | 1998-06-23 | Sgs-Thomson Microelectronics, Inc. | Field effect device with polycrystalline silicon channel |
JPH0459783B2 (en) * | 1989-04-10 | 1992-09-24 | Seiko Epson Corp | |
JPH0421349B2 (en) * | 1989-04-10 | 1992-04-09 | Seiko Epson Corp | |
JPH0221655A (en) * | 1989-04-10 | 1990-01-24 | Seiko Epson Corp | Cmos memory cell |
JPH0214565A (en) * | 1989-04-10 | 1990-01-18 | Seiko Epson Corp | Cmos memory cell |
JPH0421348B2 (en) * | 1989-04-10 | 1992-04-09 | Seiko Epson Corp | |
JPH0214566A (en) * | 1989-04-10 | 1990-01-18 | Seiko Epson Corp | Cmos memory cell |
EP0877425A2 (en) * | 1990-05-31 | 1998-11-11 | STMicroelectronics, Inc. | Field effect device with polycrystalline silicon channel |
EP0952614A1 (en) * | 1990-05-31 | 1999-10-27 | STMicroelectronics, Inc. | Field effect device with polycrystaline silicon channel |
EP0877425A3 (en) * | 1990-05-31 | 1999-04-21 | STMicroelectronics, Inc. | Field effect device with polycrystalline silicon channel |
JPH04211166A (en) * | 1991-01-28 | 1992-08-03 | Seiko Epson Corp | Semiconductor device |
US5298764A (en) * | 1991-03-08 | 1994-03-29 | Hitachi, Ltd. | Semiconductor memory device having a field effect transistor with a channel formed from a polycrystalline silicon film |
JPH06227424A (en) * | 1991-06-03 | 1994-08-16 | Norin Suisansyo Shikoku Nogyo Shikenjo | Tractor |
JPH0677436A (en) * | 1992-02-24 | 1994-03-18 | Seiko Epson Corp | Random access memory |
JPH0669458A (en) * | 1992-02-24 | 1994-03-11 | Seiko Epson Corp | Memory cell |
US5536951A (en) * | 1993-06-24 | 1996-07-16 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device having thin film transistor with diffusion preventing layer |
Also Published As
Publication number | Publication date |
---|---|
JPS611900B2 (en) | 1986-01-21 |
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