JPS5469926A - Test equipment for magnetic bubble element - Google Patents

Test equipment for magnetic bubble element

Info

Publication number
JPS5469926A
JPS5469926A JP13701977A JP13701977A JPS5469926A JP S5469926 A JPS5469926 A JP S5469926A JP 13701977 A JP13701977 A JP 13701977A JP 13701977 A JP13701977 A JP 13701977A JP S5469926 A JPS5469926 A JP S5469926A
Authority
JP
Japan
Prior art keywords
driving
speed
wafer
magnetic field
bubble element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13701977A
Other languages
Japanese (ja)
Other versions
JPS5812669B2 (en
Inventor
Seiichi Iwasa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP52137019A priority Critical patent/JPS5812669B2/en
Publication of JPS5469926A publication Critical patent/JPS5469926A/en
Publication of JPS5812669B2 publication Critical patent/JPS5812669B2/en
Expired legal-status Critical Current

Links

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

PURPOSE: To make it possible to exercise tests of both high-speed and low-speed driving wafers, by enabling the appropriate replacement of the wafer fixing table of a magnetic bubble element.
CONSTITUTION: Wafer 7 of the magnetic bubble element is fitted onto wafer fixing support part 10 and a bias magnetic field is generated by bias coils 1 and 2; and then, a rotating driving magnetic field is generated by upper and lower driving coils 3 and 4, and support part 10 is moved horizontally to make the terminal of each chip of the wafer in contact with measuring probe 6, thereby discriminating the quality of the bubble. Corresponding to the speed of the rotating magnetic field to be applied, wafer fixing table 9 is replaced adequately, i.e. an insulating one for low-speed driving or conductive one for high-speed driving is selected; and the impedance of a high-speed one is reduced by operating only driving coil 3, so that the upper limit of the driving frequency will be increased.
COPYRIGHT: (C)1979,JPO&Japio
JP52137019A 1977-11-15 1977-11-15 Magnetic bubble element testing equipment Expired JPS5812669B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP52137019A JPS5812669B2 (en) 1977-11-15 1977-11-15 Magnetic bubble element testing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP52137019A JPS5812669B2 (en) 1977-11-15 1977-11-15 Magnetic bubble element testing equipment

Publications (2)

Publication Number Publication Date
JPS5469926A true JPS5469926A (en) 1979-06-05
JPS5812669B2 JPS5812669B2 (en) 1983-03-09

Family

ID=15188920

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52137019A Expired JPS5812669B2 (en) 1977-11-15 1977-11-15 Magnetic bubble element testing equipment

Country Status (1)

Country Link
JP (1) JPS5812669B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60164653A (en) * 1984-02-06 1985-08-27 オプテイマイザ−リミツテツド Fuel efficiency improvement apparatus and its use

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5086938A (en) * 1973-12-01 1975-07-12
JPS51104230A (en) * 1975-02-11 1976-09-14 Rockwell International Corp
JPS51126733A (en) * 1975-04-25 1976-11-05 Fujitsu Ltd Bubble memory characteristic measuring method.
JPS52112241A (en) * 1976-03-16 1977-09-20 Rockwell International Corp Magnetic bubble domain device
JPS5316534A (en) * 1976-07-30 1978-02-15 Hitachi Ltd Test unit for magnetic bubble wafer

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5086938A (en) * 1973-12-01 1975-07-12
JPS51104230A (en) * 1975-02-11 1976-09-14 Rockwell International Corp
JPS51126733A (en) * 1975-04-25 1976-11-05 Fujitsu Ltd Bubble memory characteristic measuring method.
JPS52112241A (en) * 1976-03-16 1977-09-20 Rockwell International Corp Magnetic bubble domain device
JPS5316534A (en) * 1976-07-30 1978-02-15 Hitachi Ltd Test unit for magnetic bubble wafer

Also Published As

Publication number Publication date
JPS5812669B2 (en) 1983-03-09

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