JPS5469926A - Test equipment for magnetic bubble element - Google Patents
Test equipment for magnetic bubble elementInfo
- Publication number
- JPS5469926A JPS5469926A JP13701977A JP13701977A JPS5469926A JP S5469926 A JPS5469926 A JP S5469926A JP 13701977 A JP13701977 A JP 13701977A JP 13701977 A JP13701977 A JP 13701977A JP S5469926 A JPS5469926 A JP S5469926A
- Authority
- JP
- Japan
- Prior art keywords
- driving
- speed
- wafer
- magnetic field
- bubble element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
PURPOSE: To make it possible to exercise tests of both high-speed and low-speed driving wafers, by enabling the appropriate replacement of the wafer fixing table of a magnetic bubble element.
CONSTITUTION: Wafer 7 of the magnetic bubble element is fitted onto wafer fixing support part 10 and a bias magnetic field is generated by bias coils 1 and 2; and then, a rotating driving magnetic field is generated by upper and lower driving coils 3 and 4, and support part 10 is moved horizontally to make the terminal of each chip of the wafer in contact with measuring probe 6, thereby discriminating the quality of the bubble. Corresponding to the speed of the rotating magnetic field to be applied, wafer fixing table 9 is replaced adequately, i.e. an insulating one for low-speed driving or conductive one for high-speed driving is selected; and the impedance of a high-speed one is reduced by operating only driving coil 3, so that the upper limit of the driving frequency will be increased.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP52137019A JPS5812669B2 (en) | 1977-11-15 | 1977-11-15 | Magnetic bubble element testing equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP52137019A JPS5812669B2 (en) | 1977-11-15 | 1977-11-15 | Magnetic bubble element testing equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5469926A true JPS5469926A (en) | 1979-06-05 |
JPS5812669B2 JPS5812669B2 (en) | 1983-03-09 |
Family
ID=15188920
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP52137019A Expired JPS5812669B2 (en) | 1977-11-15 | 1977-11-15 | Magnetic bubble element testing equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5812669B2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60164653A (en) * | 1984-02-06 | 1985-08-27 | オプテイマイザ−リミツテツド | Fuel efficiency improvement apparatus and its use |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5086938A (en) * | 1973-12-01 | 1975-07-12 | ||
JPS51104230A (en) * | 1975-02-11 | 1976-09-14 | Rockwell International Corp | |
JPS51126733A (en) * | 1975-04-25 | 1976-11-05 | Fujitsu Ltd | Bubble memory characteristic measuring method. |
JPS52112241A (en) * | 1976-03-16 | 1977-09-20 | Rockwell International Corp | Magnetic bubble domain device |
JPS5316534A (en) * | 1976-07-30 | 1978-02-15 | Hitachi Ltd | Test unit for magnetic bubble wafer |
-
1977
- 1977-11-15 JP JP52137019A patent/JPS5812669B2/en not_active Expired
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5086938A (en) * | 1973-12-01 | 1975-07-12 | ||
JPS51104230A (en) * | 1975-02-11 | 1976-09-14 | Rockwell International Corp | |
JPS51126733A (en) * | 1975-04-25 | 1976-11-05 | Fujitsu Ltd | Bubble memory characteristic measuring method. |
JPS52112241A (en) * | 1976-03-16 | 1977-09-20 | Rockwell International Corp | Magnetic bubble domain device |
JPS5316534A (en) * | 1976-07-30 | 1978-02-15 | Hitachi Ltd | Test unit for magnetic bubble wafer |
Also Published As
Publication number | Publication date |
---|---|
JPS5812669B2 (en) | 1983-03-09 |
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