JPS5466185A - Measuring method of magnetization dispersion - Google Patents

Measuring method of magnetization dispersion

Info

Publication number
JPS5466185A
JPS5466185A JP13295677A JP13295677A JPS5466185A JP S5466185 A JPS5466185 A JP S5466185A JP 13295677 A JP13295677 A JP 13295677A JP 13295677 A JP13295677 A JP 13295677A JP S5466185 A JPS5466185 A JP S5466185A
Authority
JP
Japan
Prior art keywords
intensity
magnetization
dispersion
polarizer
analyzer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13295677A
Other languages
Japanese (ja)
Other versions
JPS6052384B2 (en
Inventor
Fushinobu Wakamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP13295677A priority Critical patent/JPS6052384B2/en
Publication of JPS5466185A publication Critical patent/JPS5466185A/en
Publication of JPS6052384B2 publication Critical patent/JPS6052384B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Measuring Magnetic Variables (AREA)

Abstract

PURPOSE: To make possible obtaining dispersion of magnetization from intensity of reflected light by letting linearly polarized light enter the surface of a magnetic material and measuring the reflection intensity thereof by changing the special position (angle) of polarizer and analyzer more than twice.
CONSTITUTION: When the linearly polarized light having passed through a polarizer P reflects on the surface of a magnetic material S, the plane (b) of polarization rotates by ϕ. When the light passes through an analyzer A whose plane (b) of polarization has rotated by θ, its intensity becomes I(θ.r) = I0COS2(θ - ϕ). I0 denotes the intensity per unit area of reflected light and (r) the position on the radiation plane. The intensity I measured with a detector D is measured as the integrated value of radiation area S. The reflection intensity of the special position of the polarizer and analyzer is measured from the formula of magnetization dispersion (Δϕ)2 by using the intensity A at θ = π/4, the intensity B at θ = 0 and I0S = C, whereby the magnetization dispersion may be readily obtained.
COPYRIGHT: (C)1979,JPO&Japio
JP13295677A 1977-11-04 1977-11-04 How to measure magnetization variation Expired JPS6052384B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13295677A JPS6052384B2 (en) 1977-11-04 1977-11-04 How to measure magnetization variation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13295677A JPS6052384B2 (en) 1977-11-04 1977-11-04 How to measure magnetization variation

Publications (2)

Publication Number Publication Date
JPS5466185A true JPS5466185A (en) 1979-05-28
JPS6052384B2 JPS6052384B2 (en) 1985-11-19

Family

ID=15093419

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13295677A Expired JPS6052384B2 (en) 1977-11-04 1977-11-04 How to measure magnetization variation

Country Status (1)

Country Link
JP (1) JPS6052384B2 (en)

Also Published As

Publication number Publication date
JPS6052384B2 (en) 1985-11-19

Similar Documents

Publication Publication Date Title
JPS51122483A (en) Scanner type inspection device
JPS533363A (en) Measurement method and measurement device
JPS5466185A (en) Measuring method of magnetization dispersion
CA2043020A1 (en) Device for and method of measurement of an angle of incidence of a luminous beam
JPS5483853A (en) Measuring device
JPS6425029A (en) Measuring device of verdet's constant
GB1523604A (en) Method of measuring the roughness of a surface
JPS557654A (en) Measuring unit for variance of refractive index
JPS5612729A (en) ?alignmening device for ic projection exposure equipment
JPS5624314A (en) Optical isolator
JPS5257843A (en) Measuring device for thickness of film
SU862096A2 (en) Optical polarization device for probing atmosphere
JPS53146652A (en) Optical line structure measuring device
JPS5342759A (en) Interference measuring method
JPS5324233A (en) Pattern examination system
JPS54128770A (en) Voltmeter
SU593083A1 (en) Temperature measuring device
SU367377A1 (en) NON-DESTRUCTIVE METHOD OF MEASURING THE CONCENTRATION AND MOBILITY OF CHARGE MEDIA IN SEMICONDUCTOR MATERIALS
JPS5594144A (en) Atomic-absorption photometer using zeeman effect
JPS52129447A (en) Photographic readout apparatus
Monin et al. A new photoelectric ellipsometer
JPS5436966A (en) Thickness measuring device
JPS53120552A (en) Evaluation method of plating surface
JPS5473690A (en) Method and apparatus for measuring linearity of photo detectors
JPS5251968A (en) Device for measuring shape of edge