JPS5441679A - Test method of semiconductor device - Google Patents

Test method of semiconductor device

Info

Publication number
JPS5441679A
JPS5441679A JP10861577A JP10861577A JPS5441679A JP S5441679 A JPS5441679 A JP S5441679A JP 10861577 A JP10861577 A JP 10861577A JP 10861577 A JP10861577 A JP 10861577A JP S5441679 A JPS5441679 A JP S5441679A
Authority
JP
Japan
Prior art keywords
semiconductor device
test method
collector
base
emitter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10861577A
Other languages
Japanese (ja)
Inventor
Kuniaki Morimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP10861577A priority Critical patent/JPS5441679A/en
Publication of JPS5441679A publication Critical patent/JPS5441679A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To make unnecessary the heating furnace, by performing the high temperature characteristic test such as base to emitter forward, collector to base or collector to emitter reverse current and dielectric strength voltage after the maximum rating operation test and before cooling with heat dissipation.
COPYRIGHT: (C)1979,JPO&Japio
JP10861577A 1977-09-09 1977-09-09 Test method of semiconductor device Pending JPS5441679A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10861577A JPS5441679A (en) 1977-09-09 1977-09-09 Test method of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10861577A JPS5441679A (en) 1977-09-09 1977-09-09 Test method of semiconductor device

Publications (1)

Publication Number Publication Date
JPS5441679A true JPS5441679A (en) 1979-04-03

Family

ID=14489277

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10861577A Pending JPS5441679A (en) 1977-09-09 1977-09-09 Test method of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5441679A (en)

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