JPS5436149A - Test unit for semiconductor integrated circuit - Google Patents

Test unit for semiconductor integrated circuit

Info

Publication number
JPS5436149A
JPS5436149A JP10294577A JP10294577A JPS5436149A JP S5436149 A JPS5436149 A JP S5436149A JP 10294577 A JP10294577 A JP 10294577A JP 10294577 A JP10294577 A JP 10294577A JP S5436149 A JPS5436149 A JP S5436149A
Authority
JP
Japan
Prior art keywords
integrated circuit
semiconductor integrated
test unit
electrodes
measure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10294577A
Other languages
Japanese (ja)
Inventor
Takashi Yamaguchi
Koichi Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP10294577A priority Critical patent/JPS5436149A/en
Publication of JPS5436149A publication Critical patent/JPS5436149A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To enable to measure the result of bonding connection in a short time, by simultaneously detecting the voltage for all the electrodes other than the common electrode of a plurality of circuit elements.
COPYRIGHT: (C)1979,JPO&Japio
JP10294577A 1977-08-26 1977-08-26 Test unit for semiconductor integrated circuit Pending JPS5436149A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10294577A JPS5436149A (en) 1977-08-26 1977-08-26 Test unit for semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10294577A JPS5436149A (en) 1977-08-26 1977-08-26 Test unit for semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPS5436149A true JPS5436149A (en) 1979-03-16

Family

ID=14340954

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10294577A Pending JPS5436149A (en) 1977-08-26 1977-08-26 Test unit for semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS5436149A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60113165A (en) * 1983-11-25 1985-06-19 Mitsubishi Electric Corp Burn-in device of semiconductor element

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60113165A (en) * 1983-11-25 1985-06-19 Mitsubishi Electric Corp Burn-in device of semiconductor element

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