JPS54161356A - Testing method of interface contacting condition - Google Patents

Testing method of interface contacting condition

Info

Publication number
JPS54161356A
JPS54161356A JP7008178A JP7008178A JPS54161356A JP S54161356 A JPS54161356 A JP S54161356A JP 7008178 A JP7008178 A JP 7008178A JP 7008178 A JP7008178 A JP 7008178A JP S54161356 A JPS54161356 A JP S54161356A
Authority
JP
Japan
Prior art keywords
contacting
scr
contacting condition
copper plate
main electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7008178A
Other languages
Japanese (ja)
Inventor
Naomichi Goto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP7008178A priority Critical patent/JPS54161356A/en
Publication of JPS54161356A publication Critical patent/JPS54161356A/en
Pending legal-status Critical Current

Links

Landscapes

  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)

Abstract

PURPOSE: To test the contacting condition in an easy manner by supplying pulses of high current to the conductive surface of the metal, which is axidizable in the air, within a short time to effect the instant temperature rise so that only the portion of deteriorated contacting condition may be forcibly oxidized.
CONSTITUTION: A silicone element of SCR 2 has its one end face formed with an aluminum evaporated film 21, with which a copper plate plated with cupro-nickel is forced into contact so that the contacting surfaces are formed between the two conductors 21 and 22. The copper plate 22 becomes a main electrode of the SCR 2, and an AC power source 1 is applied between the main electrode and the main electrode which is disposed at the opposite side to the copper plate 22. The gate electrode of the SCR 2 is supplied with the output of a single pulse generator 3. As a result, the portion of the aluminum film 21, which has a deteoriorated contacting condition and which is contacting with the air, is oxidized so that the contacting condition between the contacting conductors can be easily tested.
COPYRIGHT: (C)1979,JPO&Japio
JP7008178A 1978-06-09 1978-06-09 Testing method of interface contacting condition Pending JPS54161356A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7008178A JPS54161356A (en) 1978-06-09 1978-06-09 Testing method of interface contacting condition

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7008178A JPS54161356A (en) 1978-06-09 1978-06-09 Testing method of interface contacting condition

Publications (1)

Publication Number Publication Date
JPS54161356A true JPS54161356A (en) 1979-12-20

Family

ID=13421225

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7008178A Pending JPS54161356A (en) 1978-06-09 1978-06-09 Testing method of interface contacting condition

Country Status (1)

Country Link
JP (1) JPS54161356A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4558590A (en) * 1984-04-27 1985-12-17 International Business Machines Corporation Method for measuring the real contact area in connectors
JPH01148949A (en) * 1987-12-07 1989-06-12 Nippon Steel Corp Method and apparatus for reproducing rough particle region of neck part of bonding wire

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4558590A (en) * 1984-04-27 1985-12-17 International Business Machines Corporation Method for measuring the real contact area in connectors
JPH01148949A (en) * 1987-12-07 1989-06-12 Nippon Steel Corp Method and apparatus for reproducing rough particle region of neck part of bonding wire

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