JPS54161356A - Testing method of interface contacting condition - Google Patents
Testing method of interface contacting conditionInfo
- Publication number
- JPS54161356A JPS54161356A JP7008178A JP7008178A JPS54161356A JP S54161356 A JPS54161356 A JP S54161356A JP 7008178 A JP7008178 A JP 7008178A JP 7008178 A JP7008178 A JP 7008178A JP S54161356 A JPS54161356 A JP S54161356A
- Authority
- JP
- Japan
- Prior art keywords
- contacting
- scr
- contacting condition
- copper plate
- main electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
PURPOSE: To test the contacting condition in an easy manner by supplying pulses of high current to the conductive surface of the metal, which is axidizable in the air, within a short time to effect the instant temperature rise so that only the portion of deteriorated contacting condition may be forcibly oxidized.
CONSTITUTION: A silicone element of SCR 2 has its one end face formed with an aluminum evaporated film 21, with which a copper plate plated with cupro-nickel is forced into contact so that the contacting surfaces are formed between the two conductors 21 and 22. The copper plate 22 becomes a main electrode of the SCR 2, and an AC power source 1 is applied between the main electrode and the main electrode which is disposed at the opposite side to the copper plate 22. The gate electrode of the SCR 2 is supplied with the output of a single pulse generator 3. As a result, the portion of the aluminum film 21, which has a deteoriorated contacting condition and which is contacting with the air, is oxidized so that the contacting condition between the contacting conductors can be easily tested.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7008178A JPS54161356A (en) | 1978-06-09 | 1978-06-09 | Testing method of interface contacting condition |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7008178A JPS54161356A (en) | 1978-06-09 | 1978-06-09 | Testing method of interface contacting condition |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS54161356A true JPS54161356A (en) | 1979-12-20 |
Family
ID=13421225
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7008178A Pending JPS54161356A (en) | 1978-06-09 | 1978-06-09 | Testing method of interface contacting condition |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54161356A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4558590A (en) * | 1984-04-27 | 1985-12-17 | International Business Machines Corporation | Method for measuring the real contact area in connectors |
JPH01148949A (en) * | 1987-12-07 | 1989-06-12 | Nippon Steel Corp | Method and apparatus for reproducing rough particle region of neck part of bonding wire |
-
1978
- 1978-06-09 JP JP7008178A patent/JPS54161356A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4558590A (en) * | 1984-04-27 | 1985-12-17 | International Business Machines Corporation | Method for measuring the real contact area in connectors |
JPH01148949A (en) * | 1987-12-07 | 1989-06-12 | Nippon Steel Corp | Method and apparatus for reproducing rough particle region of neck part of bonding wire |
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