JPS5415768A - Electooptic measuring method of dimension profile of rolling bar material and its device - Google Patents

Electooptic measuring method of dimension profile of rolling bar material and its device

Info

Publication number
JPS5415768A
JPS5415768A JP3091578A JP3091578A JPS5415768A JP S5415768 A JPS5415768 A JP S5415768A JP 3091578 A JP3091578 A JP 3091578A JP 3091578 A JP3091578 A JP 3091578A JP S5415768 A JPS5415768 A JP S5415768A
Authority
JP
Japan
Prior art keywords
electooptic
measuring method
bar material
rolling bar
dimension profile
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3091578A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6137562B2 (enrdf_load_stackoverflow
Inventor
Ruisu Garanisu Tomu
Reo Hofunaa Jiyoeru
Kurisutei Kuraimaa Jiyon
Sutaan Hosutetaa Ji Richiyaado
Toomasu Jiyonzu Deyuan
Uein Ieekusu Ronarudo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bethlehem Steel Corp
Original Assignee
Bethlehem Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US05/778,809 external-priority patent/US4121292A/en
Priority claimed from US05/778,810 external-priority patent/US4121294A/en
Application filed by Bethlehem Steel Corp filed Critical Bethlehem Steel Corp
Publication of JPS5415768A publication Critical patent/JPS5415768A/ja
Publication of JPS6137562B2 publication Critical patent/JPS6137562B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21B—ROLLING OF METAL
    • B21B38/00—Methods or devices for measuring, detecting or monitoring specially adapted for metal-rolling mills, e.g. position detection, inspection of the product
    • B21B38/04—Methods or devices for measuring, detecting or monitoring specially adapted for metal-rolling mills, e.g. position detection, inspection of the product for measuring thickness, width, diameter or other transverse dimensions of the product
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
    • G01B11/105—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Control Of Metal Rolling (AREA)
JP3091578A 1977-03-17 1978-03-17 Electooptic measuring method of dimension profile of rolling bar material and its device Granted JPS5415768A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US05/778,809 US4121292A (en) 1977-03-17 1977-03-17 Electro-optical gaging system having dual cameras on a scanner
US05/778,810 US4121294A (en) 1977-03-17 1977-03-17 Electro-optical gaging system

Publications (2)

Publication Number Publication Date
JPS5415768A true JPS5415768A (en) 1979-02-05
JPS6137562B2 JPS6137562B2 (enrdf_load_stackoverflow) 1986-08-25

Family

ID=27119507

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3091578A Granted JPS5415768A (en) 1977-03-17 1978-03-17 Electooptic measuring method of dimension profile of rolling bar material and its device

Country Status (9)

Country Link
JP (1) JPS5415768A (enrdf_load_stackoverflow)
CA (1) CA1125915A (enrdf_load_stackoverflow)
DE (1) DE2811707A1 (enrdf_load_stackoverflow)
FR (1) FR2384234A1 (enrdf_load_stackoverflow)
GB (1) GB1597564A (enrdf_load_stackoverflow)
IT (1) IT1109651B (enrdf_load_stackoverflow)
LU (1) LU79257A1 (enrdf_load_stackoverflow)
NL (1) NL7802956A (enrdf_load_stackoverflow)
SE (1) SE429163C (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004239908A (ja) * 2003-02-05 2004-08-26 Hauni Maschinenbau Ag 特にたばこ製造業における、棒状体の直径を測定するための装置および方法
WO2004074768A1 (ja) * 2003-02-20 2004-09-02 Ihi Aerospace Co.,Ltd. 撮像装置

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5567607A (en) * 1978-11-17 1980-05-21 Hajime Sangyo Kk Pattern discrimination method
DE2927410A1 (de) * 1979-07-06 1981-01-08 Siemens Ag Anordnung zur ueberwachung des laengsprofils von geschliffenen zylinderbolzen
DE4013792C2 (de) * 1990-04-28 1994-11-03 Wolfgang Madlener Längenmeßvorrichtung
DE4105838A1 (de) * 1991-02-25 1992-09-03 Rheydt Kabelwerk Ag Optoelektronisches messverfahren
DE19829670A1 (de) * 1997-07-04 1999-01-07 Visicontrol Ges Fuer Elektroni Vorrichtung zur Vermessung von heißen Gegenständen
EP1954957B1 (de) 2005-12-02 2014-10-08 HOS Hottinger Systems GbR Vorrichtung zur durchgängigkeitsinspektion von durchgehenden belüftungskanälen einer bremsscheibe
DE102005061834B4 (de) 2005-12-23 2007-11-08 Ioss Intelligente Optische Sensoren & Systeme Gmbh Vorrichtung und Verfahren zum optischen Prüfen einer Oberfläche
KR100891842B1 (ko) * 2007-08-28 2009-04-07 주식회사 포스코 원형 선재 광학결함 검출장치 및 방법

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4958864A (enrdf_load_stackoverflow) * 1972-10-05 1974-06-07
JPS4990559A (enrdf_load_stackoverflow) * 1972-12-28 1974-08-29
JPS49111665A (enrdf_load_stackoverflow) * 1973-02-22 1974-10-24
JPS50103366A (enrdf_load_stackoverflow) * 1974-01-14 1975-08-15
JPS50123362A (enrdf_load_stackoverflow) * 1974-03-14 1975-09-27

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE752635A (fr) * 1970-06-26 1970-12-28 Centre Rech Metallurgique Procede de mesure d'une dimension telle qu'une largeur,
US3897156A (en) * 1971-07-27 1975-07-29 Atmospheric Sciences Inc Structure for measuring the average diameter of an approximately circular cross-section of an object
US3820366A (en) * 1972-11-06 1974-06-28 Westinghouse Electric Corp Rolling mill gauge control method and apparatus including temperatureand hardness correction
JPS5737806B2 (enrdf_load_stackoverflow) * 1972-12-27 1982-08-12
US3856412A (en) * 1973-06-08 1974-12-24 Zygo Corp Optical noncontacting gauge
US3907439A (en) * 1973-08-14 1975-09-23 Zygo Corp Edge-sensing with a scanning laser beam
SE376968B (enrdf_load_stackoverflow) * 1973-10-12 1975-06-16 Aga Ab
DE2516756A1 (de) * 1975-04-16 1976-10-28 Betr Forsch Inst Angew Forsch Verfahren und vorrichtung zur bestimmung einer flaechenabmessung in einer ebene

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4958864A (enrdf_load_stackoverflow) * 1972-10-05 1974-06-07
JPS4990559A (enrdf_load_stackoverflow) * 1972-12-28 1974-08-29
JPS49111665A (enrdf_load_stackoverflow) * 1973-02-22 1974-10-24
JPS50103366A (enrdf_load_stackoverflow) * 1974-01-14 1975-08-15
JPS50123362A (enrdf_load_stackoverflow) * 1974-03-14 1975-09-27

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004239908A (ja) * 2003-02-05 2004-08-26 Hauni Maschinenbau Ag 特にたばこ製造業における、棒状体の直径を測定するための装置および方法
WO2004074768A1 (ja) * 2003-02-20 2004-09-02 Ihi Aerospace Co.,Ltd. 撮像装置
US7456859B2 (en) 2003-02-20 2008-11-25 Ihi Aerospace Co., Ltd. Image pickup device

Also Published As

Publication number Publication date
IT1109651B (it) 1985-12-23
JPS6137562B2 (enrdf_load_stackoverflow) 1986-08-25
NL7802956A (nl) 1978-09-19
SE429163B (sv) 1983-08-15
LU79257A1 (fr) 1978-11-03
GB1597564A (en) 1981-09-09
FR2384234A1 (fr) 1978-10-13
SE7802955L (sv) 1978-09-18
FR2384234B1 (enrdf_load_stackoverflow) 1984-06-01
CA1125915A (en) 1982-06-15
DE2811707A1 (de) 1979-02-22
SE429163C (sv) 1985-11-18
IT7867593A0 (it) 1978-03-17

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