JPS54140580A - Photometer - Google Patents

Photometer

Info

Publication number
JPS54140580A
JPS54140580A JP4772278A JP4772278A JPS54140580A JP S54140580 A JPS54140580 A JP S54140580A JP 4772278 A JP4772278 A JP 4772278A JP 4772278 A JP4772278 A JP 4772278A JP S54140580 A JPS54140580 A JP S54140580A
Authority
JP
Japan
Prior art keywords
cells
cell
shutters
spectrometer
driving mechanism
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4772278A
Other languages
Japanese (ja)
Inventor
Yoshiteru Furuta
Kazuyoshi Hiragoori
Naoya Ono
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP4772278A priority Critical patent/JPS54140580A/en
Publication of JPS54140580A publication Critical patent/JPS54140580A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/30Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/36Investigating two or more bands of a spectrum by separate detectors

Abstract

PURPOSE:To improve the photometric efficiency by mounting a shutter in an openable manner in a photoelectric detector so that the light received by the detector prior to the measurements of the respective cells is blocked to eliminate the phenomena of residual images. CONSTITUTION:The light from its source 1 enters a spectrometer 12 through the sample cell of a cell unit which is intermittently moved transversely. The flux of light entering a recessed diffraction grating 2 from the incident slit 13 of the spectrometer 12 is subjected to spectroscopy and condensed so that it goes into a plurality of photoelectric converting elements 3 and is detected. Immediately in front thereof, a plurality of shutters 4 are provided. These shutters 4 are adapted to be opened, when the sample cells are to be measured, by a shutter driving mechanism 11 which is made operative in response to the signals from a control circuit 9. On the other hand, the unit 5 connected with the nunerous cells is moved by a cell driving mechanism 10. The singls to move the same are also generated from the circuit 9. Thus, the phorometric efficiency can be improved.
JP4772278A 1978-04-24 1978-04-24 Photometer Pending JPS54140580A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4772278A JPS54140580A (en) 1978-04-24 1978-04-24 Photometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4772278A JPS54140580A (en) 1978-04-24 1978-04-24 Photometer

Publications (1)

Publication Number Publication Date
JPS54140580A true JPS54140580A (en) 1979-10-31

Family

ID=12783204

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4772278A Pending JPS54140580A (en) 1978-04-24 1978-04-24 Photometer

Country Status (1)

Country Link
JP (1) JPS54140580A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4462688A (en) * 1981-11-16 1984-07-31 Nathan Gold Spectrally tailored wafer chuck shaped light meter
US4647199A (en) * 1984-09-14 1987-03-03 The Perkin-Elmer Corporation Automatic shutter system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4462688A (en) * 1981-11-16 1984-07-31 Nathan Gold Spectrally tailored wafer chuck shaped light meter
US4647199A (en) * 1984-09-14 1987-03-03 The Perkin-Elmer Corporation Automatic shutter system

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