JPS54136181A - Test method for semiconductor memory unit of tri-state output - Google Patents
Test method for semiconductor memory unit of tri-state outputInfo
- Publication number
- JPS54136181A JPS54136181A JP4318878A JP4318878A JPS54136181A JP S54136181 A JPS54136181 A JP S54136181A JP 4318878 A JP4318878 A JP 4318878A JP 4318878 A JP4318878 A JP 4318878A JP S54136181 A JPS54136181 A JP S54136181A
- Authority
- JP
- Japan
- Prior art keywords
- potential
- logic level
- memory unit
- low
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4318878A JPS54136181A (en) | 1978-04-14 | 1978-04-14 | Test method for semiconductor memory unit of tri-state output |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4318878A JPS54136181A (en) | 1978-04-14 | 1978-04-14 | Test method for semiconductor memory unit of tri-state output |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS54136181A true JPS54136181A (en) | 1979-10-23 |
JPS5718593B2 JPS5718593B2 (fr) | 1982-04-17 |
Family
ID=12656934
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4318878A Granted JPS54136181A (en) | 1978-04-14 | 1978-04-14 | Test method for semiconductor memory unit of tri-state output |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54136181A (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59119284A (ja) * | 1982-12-27 | 1984-07-10 | Advantest Corp | 論理回路の不良解析装置 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0743413B2 (ja) * | 1984-05-09 | 1995-05-15 | 三菱電機株式会社 | 半導体試験装置 |
JPS6144371A (ja) * | 1984-08-06 | 1986-03-04 | Mitsubishi Electric Corp | 半導体試験装置 |
-
1978
- 1978-04-14 JP JP4318878A patent/JPS54136181A/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59119284A (ja) * | 1982-12-27 | 1984-07-10 | Advantest Corp | 論理回路の不良解析装置 |
JPH0436349B2 (fr) * | 1982-12-27 | 1992-06-15 | Advantest Corp |
Also Published As
Publication number | Publication date |
---|---|
JPS5718593B2 (fr) | 1982-04-17 |
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