JPS5718593B2 - - Google Patents

Info

Publication number
JPS5718593B2
JPS5718593B2 JP4318878A JP4318878A JPS5718593B2 JP S5718593 B2 JPS5718593 B2 JP S5718593B2 JP 4318878 A JP4318878 A JP 4318878A JP 4318878 A JP4318878 A JP 4318878A JP S5718593 B2 JPS5718593 B2 JP S5718593B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP4318878A
Other languages
Japanese (ja)
Other versions
JPS54136181A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4318878A priority Critical patent/JPS54136181A/ja
Publication of JPS54136181A publication Critical patent/JPS54136181A/ja
Publication of JPS5718593B2 publication Critical patent/JPS5718593B2/ja
Granted legal-status Critical Current

Links

JP4318878A 1978-04-14 1978-04-14 Test method for semiconductor memory unit of tri-state output Granted JPS54136181A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4318878A JPS54136181A (en) 1978-04-14 1978-04-14 Test method for semiconductor memory unit of tri-state output

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4318878A JPS54136181A (en) 1978-04-14 1978-04-14 Test method for semiconductor memory unit of tri-state output

Publications (2)

Publication Number Publication Date
JPS54136181A JPS54136181A (en) 1979-10-23
JPS5718593B2 true JPS5718593B2 (fr) 1982-04-17

Family

ID=12656934

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4318878A Granted JPS54136181A (en) 1978-04-14 1978-04-14 Test method for semiconductor memory unit of tri-state output

Country Status (1)

Country Link
JP (1) JPS54136181A (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3516755A1 (de) * 1984-05-09 1985-11-14 Mitsubishi Denki K.K., Tokio/Tokyo Testgeraet fuer halbleitereinrichtungen
DE3528189A1 (de) * 1984-08-06 1986-02-13 Mitsubishi Denki K.K., Tokio/Tokyo Testgeraet fuer halbleitereinrichtungen

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59119284A (ja) * 1982-12-27 1984-07-10 Advantest Corp 論理回路の不良解析装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3516755A1 (de) * 1984-05-09 1985-11-14 Mitsubishi Denki K.K., Tokio/Tokyo Testgeraet fuer halbleitereinrichtungen
US4651088A (en) * 1984-05-09 1987-03-17 Mitsubishi Denki Kabushiki Kaisha Device for testing semiconductor devices
DE3528189A1 (de) * 1984-08-06 1986-02-13 Mitsubishi Denki K.K., Tokio/Tokyo Testgeraet fuer halbleitereinrichtungen
US4720671A (en) * 1984-08-06 1988-01-19 Mitsubishi Denki Kabushiki Kaisha Semiconductor device testing device

Also Published As

Publication number Publication date
JPS54136181A (en) 1979-10-23

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