JPS54114171A - Sample shifting device for electronic microscope - Google Patents
Sample shifting device for electronic microscopeInfo
- Publication number
- JPS54114171A JPS54114171A JP2173978A JP2173978A JPS54114171A JP S54114171 A JPS54114171 A JP S54114171A JP 2173978 A JP2173978 A JP 2173978A JP 2173978 A JP2173978 A JP 2173978A JP S54114171 A JPS54114171 A JP S54114171A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- potentiometer
- circuit
- shifted
- magnification ratio
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Sampling And Sample Adjustment (AREA)
Abstract
PURPOSE: To secure the constant shift direction for the samle image at all times even with variation of the magnification ratio and thus to ensure an easy selection of the viewfield by securing an automatic correction for the shift direction of the sample image caused by the turn of the sample of the electronic microscope.
CONSTITUTION: When the observation magnification ratio of sample 4 is set to standard ratio M0, the signals of the rotary angle corresponding to the zero degree are transmitted to X-direction circuit 14X, 14Y, 15X and 15Y respectively from memory circuit 9. The voltage is increased by X0 via X-direction potentiometer 13X, and thus the variation equivalent of X0 is detected at arithmetic circuit 17X to be led to pulse conversion circuit 12X via gate 18. As a result, pulse motor 11X is driven to shift sample 4 in the X direction by X0. In the same way, sample 4 is shifted in the Y direction with operation of Y-direction potentiometer 13Y. Then the observation magnification ratio is varied from M0 to M1 with operation of lens control circuit 8, and thus sample 4 is shifted in the Y direction by -X0 via potentiometer 13X. In the same way, sample 4 is shifted in the X direction by Y0 via potentiometer 13Y.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2173978A JPS5829571B2 (en) | 1978-02-27 | 1978-02-27 | Sample moving device in electron microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2173978A JPS5829571B2 (en) | 1978-02-27 | 1978-02-27 | Sample moving device in electron microscope |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS54114171A true JPS54114171A (en) | 1979-09-06 |
JPS5829571B2 JPS5829571B2 (en) | 1983-06-23 |
Family
ID=12063433
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2173978A Expired JPS5829571B2 (en) | 1978-02-27 | 1978-02-27 | Sample moving device in electron microscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5829571B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58178949A (en) * | 1982-04-15 | 1983-10-20 | Jeol Ltd | Sample image display unit |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS596219U (en) * | 1982-07-02 | 1984-01-14 | 日本電気株式会社 | power circuit |
-
1978
- 1978-02-27 JP JP2173978A patent/JPS5829571B2/en not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58178949A (en) * | 1982-04-15 | 1983-10-20 | Jeol Ltd | Sample image display unit |
JPH0232741B2 (en) * | 1982-04-15 | 1990-07-23 | Nippon Electron Optics Lab |
Also Published As
Publication number | Publication date |
---|---|
JPS5829571B2 (en) | 1983-06-23 |
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