JPS54102966A - Impurity diffusion method - Google Patents

Impurity diffusion method

Info

Publication number
JPS54102966A
JPS54102966A JP1003178A JP1003178A JPS54102966A JP S54102966 A JPS54102966 A JP S54102966A JP 1003178 A JP1003178 A JP 1003178A JP 1003178 A JP1003178 A JP 1003178A JP S54102966 A JPS54102966 A JP S54102966A
Authority
JP
Japan
Prior art keywords
layer
substrate
boron
film
diffused
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1003178A
Other languages
Japanese (ja)
Inventor
Toshio Tanaka
Yoshiki Sugimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Home Electronics Ltd
NEC Corp
Original Assignee
NEC Home Electronics Ltd
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Home Electronics Ltd, Nippon Electric Co Ltd filed Critical NEC Home Electronics Ltd
Priority to JP1003178A priority Critical patent/JPS54102966A/en
Publication of JPS54102966A publication Critical patent/JPS54102966A/en
Pending legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

PURPOSE: To eliminate the dispersion of the impurity density and thus to form a region of a uniform impurity density by giving the stabilizing process to remove the impurities other than those diffused with the semiconductor substrate after diffusion of the impurity.
CONSTITUTION: Oxide film 11 is formed on silicon substrate 10, and window 12 is formed to film 11. Then boron silicate layer 13 is formed on the surface of substrate 10 exposed through window 12. In this case, high-density boron diffusion layer 14 is formed on substrate 10. The stabilizing treatment is given by soaking the substrate into the heated nitic/sulfuric acid, thus removing layer 13 on the surface and then exposing layer 14. After this, a heat treatment is given in the oxidizing atmosphere to form oxide film 15 on the layer 14. At the same time, the boron of layer 14 is diffused partially into film 15 to lower the impurity density. Then film 15 is removed to expose layer 14, and finally a heat treatment is applied in the steam atmosphere. Thus, the boron is diffused into substrate 10 to form P-type base region 16, at the same time forming oxide film 17 on the surface of region 16.
COPYRIGHT: (C)1979,JPO&Japio
JP1003178A 1978-01-31 1978-01-31 Impurity diffusion method Pending JPS54102966A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1003178A JPS54102966A (en) 1978-01-31 1978-01-31 Impurity diffusion method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1003178A JPS54102966A (en) 1978-01-31 1978-01-31 Impurity diffusion method

Publications (1)

Publication Number Publication Date
JPS54102966A true JPS54102966A (en) 1979-08-13

Family

ID=11739016

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1003178A Pending JPS54102966A (en) 1978-01-31 1978-01-31 Impurity diffusion method

Country Status (1)

Country Link
JP (1) JPS54102966A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4873088A (en) * 1971-12-29 1973-10-02
JPS497625A (en) * 1972-05-26 1974-01-23

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4873088A (en) * 1971-12-29 1973-10-02
JPS497625A (en) * 1972-05-26 1974-01-23

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