Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co LtdfiledCriticalNEC Corp
Priority to JP15240076ApriorityCriticalpatent/JPS5376666A/en
Publication of JPS5376666ApublicationCriticalpatent/JPS5376666A/en
PURPOSE: To form openings in two layer insulation films of different rates of etching with good accuracy by one photoetching process through the use of an ion implantation method.
COPYRIGHT: (C)1978,JPO&Japio
JP15240076A1976-12-171976-12-17Production of semiconductor device
PendingJPS5376666A
(en)