JPS5368847A - Automatic appearance inspecting device - Google Patents

Automatic appearance inspecting device

Info

Publication number
JPS5368847A
JPS5368847A JP14332976A JP14332976A JPS5368847A JP S5368847 A JPS5368847 A JP S5368847A JP 14332976 A JP14332976 A JP 14332976A JP 14332976 A JP14332976 A JP 14332976A JP S5368847 A JPS5368847 A JP S5368847A
Authority
JP
Japan
Prior art keywords
inspecting device
automatic appearance
appearance inspecting
automatic
inspecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14332976A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6113177B2 (enrdf_load_stackoverflow
Inventor
Tomohiro Kuji
Nobuyuki Akiyama
Yoshimasa Ooshima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP14332976A priority Critical patent/JPS5368847A/ja
Priority to US05/856,097 priority patent/US4242702A/en
Priority to DE2753593A priority patent/DE2753593C2/de
Publication of JPS5368847A publication Critical patent/JPS5368847A/ja
Publication of JPS6113177B2 publication Critical patent/JPS6113177B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP14332976A 1976-12-01 1976-12-01 Automatic appearance inspecting device Granted JPS5368847A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP14332976A JPS5368847A (en) 1976-12-01 1976-12-01 Automatic appearance inspecting device
US05/856,097 US4242702A (en) 1976-12-01 1977-11-30 Apparatus for automatically checking external appearance of object
DE2753593A DE2753593C2 (de) 1976-12-01 1977-12-01 Optische Prüfeinrichtung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14332976A JPS5368847A (en) 1976-12-01 1976-12-01 Automatic appearance inspecting device

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP60084479A Division JPS60247143A (ja) 1985-04-22 1985-04-22 接点の外観検査方法

Publications (2)

Publication Number Publication Date
JPS5368847A true JPS5368847A (en) 1978-06-19
JPS6113177B2 JPS6113177B2 (enrdf_load_stackoverflow) 1986-04-11

Family

ID=15336239

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14332976A Granted JPS5368847A (en) 1976-12-01 1976-12-01 Automatic appearance inspecting device

Country Status (1)

Country Link
JP (1) JPS5368847A (enrdf_load_stackoverflow)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55117944A (en) * 1979-03-05 1980-09-10 Daihen Corp Pattern automatic check method
JPS56164545A (en) * 1980-05-21 1981-12-17 Hitachi Ltd Pellet bonding inspection and device therefor
JPS5861448A (ja) * 1981-10-09 1983-04-12 Hitachi Ltd パタ−ン検査方式
JPS60125547A (ja) * 1983-12-09 1985-07-04 Fujitsu Ltd 検査装置
JPS62284267A (ja) * 1986-06-03 1987-12-10 Anritsu Corp スペクトラムアナライザ
JPS6315141A (ja) * 1986-07-07 1988-01-22 Kyodo Printing Co Ltd 繰返しパタ−ンをもつ物品の検査方法及びその装置
JP2005345386A (ja) * 2004-06-04 2005-12-15 Tdk Corp チップ部品の検査方法及びその検査装置

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55117944A (en) * 1979-03-05 1980-09-10 Daihen Corp Pattern automatic check method
JPS56164545A (en) * 1980-05-21 1981-12-17 Hitachi Ltd Pellet bonding inspection and device therefor
JPS5861448A (ja) * 1981-10-09 1983-04-12 Hitachi Ltd パタ−ン検査方式
JPS60125547A (ja) * 1983-12-09 1985-07-04 Fujitsu Ltd 検査装置
JPS62284267A (ja) * 1986-06-03 1987-12-10 Anritsu Corp スペクトラムアナライザ
JPS6315141A (ja) * 1986-07-07 1988-01-22 Kyodo Printing Co Ltd 繰返しパタ−ンをもつ物品の検査方法及びその装置
JP2005345386A (ja) * 2004-06-04 2005-12-15 Tdk Corp チップ部品の検査方法及びその検査装置

Also Published As

Publication number Publication date
JPS6113177B2 (enrdf_load_stackoverflow) 1986-04-11

Similar Documents

Publication Publication Date Title
JPS52133291A (en) Automatic microbioassay apparatus
GB1552257A (en) Automatic door-controlling device
JPS52113468A (en) Device for inspecting
JPS5336667A (en) Automatic inserting device
JPS531989A (en) Automatic bacteriaafree handdwashing device
JPS53143974A (en) Inspecting device
JPS5368847A (en) Automatic appearance inspecting device
JPS533315A (en) Automatic playing device
JPS5367987A (en) Automatic refractometer
JPS5360218A (en) Automatic playing device
JPS5332762A (en) Automatic measuring apparatus
JPS5383936A (en) Automatic plating device
JPS5294036A (en) Automatic drawing device
JPS5314500A (en) Automatic markinggoff device for largeesized parts
JPS539842A (en) Automatic painting device
JPS52101472A (en) Automatic inserting device
JPS53139993A (en) Xxray inspecting device
JPS5286347A (en) Optical inspecting device
JPS5383622A (en) Automatic electrooflashing device
JPS5322737A (en) Preliminary inspecting device
JPS52148874A (en) Automatic filterrhydroextractor
JPS5360621A (en) Automatic accompaniment device
JPS5336668A (en) Automatic inserting device
JPS5337862A (en) Automatic inserting device
JPS53143191A (en) Xxray inspecting device