JPS5323663B1 - - Google Patents

Info

Publication number
JPS5323663B1
JPS5323663B1 JP2233871A JP2233871A JPS5323663B1 JP S5323663 B1 JPS5323663 B1 JP S5323663B1 JP 2233871 A JP2233871 A JP 2233871A JP 2233871 A JP2233871 A JP 2233871A JP S5323663 B1 JPS5323663 B1 JP S5323663B1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2233871A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2233871A priority Critical patent/JPS5323663B1/ja
Priority to US00243215A priority patent/US3786268A/en
Priority to NL7204863.A priority patent/NL155979B/xx
Priority to DE19722217660 priority patent/DE2217660A1/de
Publication of JPS5323663B1 publication Critical patent/JPS5323663B1/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J3/00Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps
    • H01J3/02Electron guns
    • H01J3/021Electron guns using a field emission, photo emission, or secondary emission electron source
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/06Electron sources; Electron guns
    • H01J37/073Electron guns using field emission, photo emission, or secondary emission electron sources

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Sources, Ion Sources (AREA)
JP2233871A 1971-04-12 1971-04-12 Pending JPS5323663B1 (de)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2233871A JPS5323663B1 (de) 1971-04-12 1971-04-12
US00243215A US3786268A (en) 1971-04-12 1972-04-12 Electron gun device of field emission type
NL7204863.A NL155979B (nl) 1971-04-12 1972-04-12 Elektronenkanon van het veldemissie-type.
DE19722217660 DE2217660A1 (de) 1971-04-12 1972-04-12 Elektronenkanone des Feldemissionstyps

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2233871A JPS5323663B1 (de) 1971-04-12 1971-04-12

Publications (1)

Publication Number Publication Date
JPS5323663B1 true JPS5323663B1 (de) 1978-07-15

Family

ID=12079897

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2233871A Pending JPS5323663B1 (de) 1971-04-12 1971-04-12

Country Status (4)

Country Link
US (1) US3786268A (de)
JP (1) JPS5323663B1 (de)
DE (1) DE2217660A1 (de)
NL (1) NL155979B (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007073521A (ja) * 2005-09-05 2007-03-22 Ict Integrated Circuit Testing Ges Fuer Halbleiterprueftechnik Mbh 荷電粒子ビーム照射デバイス及び荷電粒子ビーム照射デバイスを動作させるための方法

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5420828B2 (de) * 1972-06-09 1979-07-25
DE2851743C2 (de) * 1978-11-30 1980-08-28 Kernforschungsanlage Juelich Gmbh, 5170 Juelich ElektronenstoBspektrometer
JPS57191950A (en) * 1981-05-22 1982-11-25 Hitachi Ltd Charged-particle source
WO1987004846A1 (en) * 1986-02-03 1987-08-13 Crewe Albert V Electron beam memory system with ultra-compact, high current density electron gun
US4740705A (en) * 1986-08-11 1988-04-26 Electron Beam Memories Axially compact field emission cathode assembly
US4760567A (en) * 1986-08-11 1988-07-26 Electron Beam Memories Electron beam memory system with ultra-compact, high current density electron gun
JP3131339B2 (ja) * 1993-12-22 2001-01-31 三菱電機株式会社 陰極、陰極線管および陰極線管の作動方法
US5848118A (en) * 1997-06-19 1998-12-08 Lear Corporation Method and apparatus for detecting inhomogeneities in seat assemblies
FR2792770A1 (fr) 1999-04-22 2000-10-27 Cit Alcatel Fonctionnement a haute pression d'une cathode froide a emission de champ
WO2009153939A1 (ja) 2008-06-20 2009-12-23 株式会社日立ハイテクノロジーズ 荷電粒子線装置、及びその制御方法
US8188451B1 (en) * 2008-09-24 2012-05-29 Kla-Tencor Corporation Electron generation and delivery system for contamination sensitive emitters
EP2365511B1 (de) * 2010-03-10 2013-05-08 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Rückkopplungsschleife für eine Emitter Blitzreinigung
JP6345273B2 (ja) 2014-12-26 2018-06-20 株式会社日立ハイテクノロジーズ 複合荷電粒子線装置およびその制御方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1246744A (en) * 1969-01-02 1971-09-15 Graham Stuart Plows Electron beam apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007073521A (ja) * 2005-09-05 2007-03-22 Ict Integrated Circuit Testing Ges Fuer Halbleiterprueftechnik Mbh 荷電粒子ビーム照射デバイス及び荷電粒子ビーム照射デバイスを動作させるための方法
JP2009117394A (ja) * 2005-09-05 2009-05-28 Ict Integrated Circuit Testing Ges Fuer Halbleiterprueftechnik Mbh 荷電粒子ビーム照射デバイス及び荷電粒子ビーム照射デバイスを動作させるための方法

Also Published As

Publication number Publication date
NL7204863A (de) 1972-10-16
US3786268A (en) 1974-01-15
NL155979B (nl) 1978-02-15
DE2217660A1 (de) 1972-11-16

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