JPS5323576A - Testing app aratus of semiconductor integrated circuits - Google Patents

Testing app aratus of semiconductor integrated circuits

Info

Publication number
JPS5323576A
JPS5323576A JP9808676A JP9808676A JPS5323576A JP S5323576 A JPS5323576 A JP S5323576A JP 9808676 A JP9808676 A JP 9808676A JP 9808676 A JP9808676 A JP 9808676A JP S5323576 A JPS5323576 A JP S5323576A
Authority
JP
Japan
Prior art keywords
integrated circuits
semiconductor integrated
testing app
app aratus
tested
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9808676A
Other languages
Japanese (ja)
Other versions
JPS6134102B2 (en
Inventor
Hitoshi Takaten
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP9808676A priority Critical patent/JPS5323576A/en
Publication of JPS5323576A publication Critical patent/JPS5323576A/en
Publication of JPS6134102B2 publication Critical patent/JPS6134102B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE: To avert the IC being tested from being tested of its functions by the information differing from the test items having been stored in a memory device by accurately detecting the abnormalities, even if these abnormalities simultaneously occur in the pulse drivers on the standard side and the side being tested.
COPYRIGHT: (C)1978,JPO&Japio
JP9808676A 1976-08-17 1976-08-17 Testing app aratus of semiconductor integrated circuits Granted JPS5323576A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9808676A JPS5323576A (en) 1976-08-17 1976-08-17 Testing app aratus of semiconductor integrated circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9808676A JPS5323576A (en) 1976-08-17 1976-08-17 Testing app aratus of semiconductor integrated circuits

Publications (2)

Publication Number Publication Date
JPS5323576A true JPS5323576A (en) 1978-03-04
JPS6134102B2 JPS6134102B2 (en) 1986-08-06

Family

ID=14210521

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9808676A Granted JPS5323576A (en) 1976-08-17 1976-08-17 Testing app aratus of semiconductor integrated circuits

Country Status (1)

Country Link
JP (1) JPS5323576A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05139445A (en) * 1991-11-08 1993-06-08 Akira Hirayama Loading and unloading method for transportation and device for use in the method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05139445A (en) * 1991-11-08 1993-06-08 Akira Hirayama Loading and unloading method for transportation and device for use in the method

Also Published As

Publication number Publication date
JPS6134102B2 (en) 1986-08-06

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