JPS5322333A - Fault detection system of semiconductor memory device - Google Patents

Fault detection system of semiconductor memory device

Info

Publication number
JPS5322333A
JPS5322333A JP9602776A JP9602776A JPS5322333A JP S5322333 A JPS5322333 A JP S5322333A JP 9602776 A JP9602776 A JP 9602776A JP 9602776 A JP9602776 A JP 9602776A JP S5322333 A JPS5322333 A JP S5322333A
Authority
JP
Japan
Prior art keywords
memory device
semiconductor memory
detection system
fault detection
row
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9602776A
Other languages
Japanese (ja)
Inventor
Noboru Suemori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP9602776A priority Critical patent/JPS5322333A/en
Publication of JPS5322333A publication Critical patent/JPS5322333A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/24—Memory cell safety or protection circuits, e.g. arrangements for preventing inadvertent reading or writing; Status cells; Test cells

Landscapes

  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Detection And Correction Of Errors (AREA)

Abstract

PURPOSE:At a read operation time, the parity check of read information of an IC memory group in the same row or the first and the second IC memory groups arranged in the row is executed, so that fault occurrence can be displayed every exchange unit in case of parity error occurrence.
JP9602776A 1976-08-13 1976-08-13 Fault detection system of semiconductor memory device Pending JPS5322333A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9602776A JPS5322333A (en) 1976-08-13 1976-08-13 Fault detection system of semiconductor memory device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9602776A JPS5322333A (en) 1976-08-13 1976-08-13 Fault detection system of semiconductor memory device

Publications (1)

Publication Number Publication Date
JPS5322333A true JPS5322333A (en) 1978-03-01

Family

ID=14153880

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9602776A Pending JPS5322333A (en) 1976-08-13 1976-08-13 Fault detection system of semiconductor memory device

Country Status (1)

Country Link
JP (1) JPS5322333A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59127300A (en) * 1983-01-12 1984-07-23 Hitachi Electronics Eng Co Ltd Parity checking method of mass storage memory
JPS59175093A (en) * 1983-03-22 1984-10-03 Mitsubishi Electric Corp Semiconductor memory

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59127300A (en) * 1983-01-12 1984-07-23 Hitachi Electronics Eng Co Ltd Parity checking method of mass storage memory
JPS59175093A (en) * 1983-03-22 1984-10-03 Mitsubishi Electric Corp Semiconductor memory

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